Plasma-focused ion beam for nanoscale characterisation of materials

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This project aims to enable research programmes in functional materials to characterise materials using xenon-plasma focused ion beam (FIB) instrumentation. The plasma FIB, with its fast milling speeds across large areas, will enable new three-dimensional imaging experiments and types of transmission electron microscopy samples. This will have applications in engineering, photovoltaics and environmental geosciences, which all need to analyse materials on a nanometre scale.