Plasma-focused ion beam for nanoscale characterisation of materials

用于材料纳米级表征的等离子体聚焦离子束

• 批准号: LE170100087
• 负责人: Prof Richard Tilley
• 金额: $ 73.35万
• 依托单位: The University of New South Wales
• 依托单位国家: 澳大利亚
• 项目类别: Linkage Infrastructure, Equipment and Facilities
• 财政年份: 2017
• 资助国家: 澳大利亚
• 起止时间: 2017-01-01 至 2018-06-01
• 项目状态: 已结题
• 来源: https://dataportal.arc.gov.au/RGS/Web/Grants/LE170100087
• 关键词: Plasma; focused; ion; beam; nanoscale

This project aims to enable research programmes in functional materials to characterise materials using xenon-plasma focused ion beam (FIB) instrumentation. The plasma FIB, with its fast milling speeds across large areas, will enable new three-dimensional imaging experiments and types of transmission electron microscopy samples. This will have applications in engineering, photovoltaics and environmental geosciences, which all need to analyse materials on a nanometre scale.

该项目旨在使功能材料的研究方案能够使用氙等离子体聚焦离子束（FIB）仪器来处理材料。等离子体FIB在大面积上具有快速的研磨速度，将使新的三维成像实验和透射电子显微镜样品类型成为可能。这将在工程、光化学和环境地球科学中得到应用，这些都需要在纳米尺度上分析材料。