Microcantilevers for multifrequency atomic force microscopy

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This project aims to design a microcantilever with high-performing sensors more sensitive and with better noise performance than the typical optical system used in commercial Atomic Force Microscopes (AFMs). The AFM, a nanotechnology instrument, uses a microcantilever (with an extremely shape probe) to interrogate a sample surface. It has made important discoveries in nanotechnology, life sciences, nanomachining, material science and data storage systems. Despite its success, the technique’s spatial resolution and quantitative measurements are limited. This project could lead to breakthrough technologies such as atomic force spectroscopy to study elastic modulus of nanostructures, and establish Australia's prominence in this emerging field.