Scalable nanomaterial-based circuits and optoelectronics

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Translating new materials into practical devices of benefit to society typically requires substantial time and capital investment. Devices based on isolated low-dimensional material nanostructures, such as 0D optically active defects, 1D individual nanowires, or 2D heterojunctions, have unique optoelectronic characteristics which can enable electronic and photonic applications not possible with conventional bulk materials. When scaling up these devices for integrated systems, the exact position of each constituent nanostructure needs to be known. As such, fabricating and measuring nanoscale devices, particularly for emerging materials in the early stages, is notoriously labour-intensive. This project will build upon computer-vision-based approaches such as object detection & tracking, and multi-modal data correlation, for high-throughput materials test and evaluation, device routing, and integrated system prototyping. The main objectives are: i) Demonstrate multi-technique, multi-scale characterisation, automatically performed on the same nanostructures between processing steps, to correlate material properties, track processing-induced changes, locate high-quality structures, and address the challenges of yield and scalability. ii) Prototype nanomaterial integrated systems using computer-adjustable electrode designs where a machine-learning algorithm automatically routes individual devices across a chip.