COMMISSIONING OF A CRYSTAL ANALYZER FOR INELASTIC SCATTERING AND ADVANCED SPECTR

用于非弹性散射和高级光谱的晶体分析仪的调试

• 批准号: 7598183
• 负责人: UWE BERGMANN
• 金额: $ 2.98万
• 依托单位: STANFORD UNIVERSITY
• 依托单位国家: 美国
• 财政年份: 2007
• 资助国家: 美国
• 起止时间: 2007-03-01 至 2008-02-29
• 项目状态: 已结题
• 来源: https://reporter.nih.gov/project-details/7598183
• 关键词: Complex; Computer Retrieval of Information on Scientific Projects Database; Data; Funding; Grant; Institution; Measurement; Measures; Oxygen; Photons; Range; Research; Research Personnel; Resolution; Resources; Running; Site; Source; Spectrum Analysis; Time; United States National Institutes of Health; Width; emission spectroscopy; instrument; photosystem II; research study

This subproject is one of many research subprojects utilizing the resources provided by a Center grant funded by NIH/NCRR. The subproject and investigator (PI) may have received primary funding from another NIH source, and thus could be represented in other CRISP entries. The institution listed is for the Center, which is not necessarily the institution for the investigator. An instrument for inelastic x-ray scattering and advanced spectroscopic measurements (including x-ray emission spectroscopy and site-selective EXAFS spectroscopy) was further developed. The first Resonant inelastic x-ray scattering (RIXS) measurements were made using this setup on SSRL BL6-2. A set of three Ge(110) analyzers were used for measurement of Fe K-alpha emission. Using Si(111) crystals as beam line monochromator, a total energy resolution of ~1.1 eV was measured at 6.4 keV. Assuming a Darwin width of 0.9 eV at 6.4 keV for Si(111) crystals, this indicates that the Ge(110) analyzer crystals have a resolution of better than 0.7 eV. In addition to this set of analyzers, a set of three Si(553) crystals was used to obtain Cu Kbeta" XES data. This was the second time this setup was used for Cu Kbeta" XES, and a resolution of better than 1 eV for these measurements was obtained. The RIXS and XES data from these measurements are being analyzed. Finally a newly purchased set of three Ge(111) analyzers was used in a study of range extended Mn EXAFS (beyond the Fe K edge) of the oxygen evolving complex of photosystem II. This experiment was performed at beam line 18ID at the Advanced Photon Source. We are planning to move the extended range experiments to SSRL when SPEAR3 is running at 500 mA.

这个子项目是许多研究子项目中的一个 由NIH/NCRR资助的中心赠款提供的资源。子项目和 研究者（PI）可能从另一个NIH来源获得了主要资金， 因此可以在其他CRISP条目中表示。所列机构为 研究中心，而研究中心不一定是研究者所在的机构。 进一步开发了用于非弹性X射线散射和高级光谱测量（包括X射线发射光谱和选址EXAFS光谱）的仪器。 第一个共振非弹性X射线散射（RIXS）测量是使用SSRL BL 6 -2上的这种设置进行的。 一组三个Ge（110）分析仪用于测量Fe K-α发射。 用Si（111）晶体作束线单色器，在6.4keV能量下测得总能量分辨率约为1.1eV。 假设Si（111）晶体在6.4 keV下的达尔文宽度为0.9 eV，这表明Ge（110）分析晶体具有优于0.7 eV的分辨率。 除了这组分析仪之外，还使用一组三个Si（553）晶体来获得Cu Kbeta-XES数据。 这是第二次将该装置用于Cu Kbeta-XES，并且获得了这些测量的优于1 eV的分辨率。 来自这些测量的RIXS和XES数据正在进行分析。 最后，一套新购买的三个Ge（111）分析仪被用于研究范围扩展Mn EXAFS（超越铁K边缘）的光系统II的氧释放复合物。 该实验在先进光子源的光束线18 ID处进行。 我们计划在SPEAR 3以500 mA运行时将扩展范围实验转移到SSRL。