COMMISSIONING OF A CRYSTAL ANALYZER FOR INELASTIC SCATTERING AND ADVANCED SPECTR

用于非弹性散射和高级光谱的晶体分析仪的调试

• 批准号: 7598183
• 负责人: UWE BERGMANN
• 金额: $ 2.98万
• 依托单位: STANFORD UNIVERSITY
• 依托单位国家: 美国
• 财政年份: 2007
• 资助国家: 美国
• 起止时间: 2007-03-01 至 2008-02-29
• 项目状态: 已结题
• 来源: https://reporter.nih.gov/project-details/7598183
• 关键词: Complex; Computer Retrieval of Information on Scientific Projects Database; Data; Funding; Grant; Institution; Measurement; Measures; Oxygen; Photons; Range; Research; Research Personnel; Resolution; Resources; Running; Site; Source; Spectrum Analysis; Time; United States National Institutes of Health; Width; emission spectroscopy; instrument; photosystem II; research study

This subproject is one of many research subprojects utilizing the resources provided by a Center grant funded by NIH/NCRR. The subproject and investigator (PI) may have received primary funding from another NIH source, and thus could be represented in other CRISP entries. The institution listed is for the Center, which is not necessarily the institution for the investigator. An instrument for inelastic x-ray scattering and advanced spectroscopic measurements (including x-ray emission spectroscopy and site-selective EXAFS spectroscopy) was further developed. The first Resonant inelastic x-ray scattering (RIXS) measurements were made using this setup on SSRL BL6-2. A set of three Ge(110) analyzers were used for measurement of Fe K-alpha emission. Using Si(111) crystals as beam line monochromator, a total energy resolution of ~1.1 eV was measured at 6.4 keV. Assuming a Darwin width of 0.9 eV at 6.4 keV for Si(111) crystals, this indicates that the Ge(110) analyzer crystals have a resolution of better than 0.7 eV. In addition to this set of analyzers, a set of three Si(553) crystals was used to obtain Cu Kbeta" XES data. This was the second time this setup was used for Cu Kbeta" XES, and a resolution of better than 1 eV for these measurements was obtained. The RIXS and XES data from these measurements are being analyzed. Finally a newly purchased set of three Ge(111) analyzers was used in a study of range extended Mn EXAFS (beyond the Fe K edge) of the oxygen evolving complex of photosystem II. This experiment was performed at beam line 18ID at the Advanced Photon Source. We are planning to move the extended range experiments to SSRL when SPEAR3 is running at 500 mA.

该子项目是利用该技术的众多研究子项目之一 资源由 NIH/NCRR 资助的中心拨款提供。子项目和 研究者 (PI) 可能已从 NIH 的另一个来源获得主要资金， 因此可以在其他 CRISP 条目中表示。列出的机构是 对于中心来说，它不一定是研究者的机构。 进一步开发了用于非弹性 X 射线散射和先进光谱测量（包括 X 射线发射光谱和位点选择性 EXAFS 光谱）的仪器。 首次共振非弹性 X 射线散射 (RIXS) 测量是在 SSRL BL6-2 上使用此装置进行的。 一组三台 Ge(110) 分析仪用于测量 Fe K-α 发射。 使用 Si(111) 晶体作为光束线单色仪，在 6.4 keV 处测得总能量分辨率约为 1.1 eV。 假设 Si(111) 晶体在 6.4 keV 处的达尔文宽度为 0.9 eV，这表明 Ge(110) 分析器晶体的分辨率优于 0.7 eV。 除了这套分析仪之外，还使用一组三个 Si(553) 晶体来获取 Cu Kbeta" XES 数据。这是该装置第二次用于 Cu Kbeta" XES，并且这些测量获得了优于 1 eV 的分辨率。 正在分析这些测量的 RIXS 和 XES 数据。 最后，新购买的一套三台 Ge(111) 分析仪被用于研究光系统 II 的放氧复合物的范围扩展 Mn EXAFS（超出 Fe K 边缘）。 该实验是在先进光子源的光束线 18ID 处进行的。 当 SPEAR3 以 500 mA 运行时，我们计划将扩展范围实验转移到 SSRL。