COMMISSIONING OF A CRYSTAL ANALYZER FOR INELASTIC SCATTERING AND ADVANCED SPECTR

用于非弹性散射和高级光谱的晶体分析仪的调试

• 批准号: 7598183
• 负责人: UWE BERGMANN
• 金额: $ 2.98万
• 依托单位: STANFORD UNIVERSITY
• 依托单位国家: 美国
• 财政年份: 2007
• 资助国家: 美国
• 起止时间: 2007-03-01 至 2008-02-29
• 项目状态: 已结题
• 来源: https://reporter.nih.gov/project-details/7598183
• 关键词: Complex; Computer Retrieval of Information on Scientific Projects Database; Data; Funding; Grant; Institution; Measurement; Measures; Oxygen; Photons; Range; Research; Research Personnel; Resolution; Resources; Running; Site; Source; Spectrum Analysis; Time; United States National Institutes of Health; Width; emission spectroscopy; instrument; photosystem II; research study

This subproject is one of many research subprojects utilizing the resources provided by a Center grant funded by NIH/NCRR. The subproject and investigator (PI) may have received primary funding from another NIH source, and thus could be represented in other CRISP entries. The institution listed is for the Center, which is not necessarily the institution for the investigator. An instrument for inelastic x-ray scattering and advanced spectroscopic measurements (including x-ray emission spectroscopy and site-selective EXAFS spectroscopy) was further developed. The first Resonant inelastic x-ray scattering (RIXS) measurements were made using this setup on SSRL BL6-2. A set of three Ge(110) analyzers were used for measurement of Fe K-alpha emission. Using Si(111) crystals as beam line monochromator, a total energy resolution of ~1.1 eV was measured at 6.4 keV. Assuming a Darwin width of 0.9 eV at 6.4 keV for Si(111) crystals, this indicates that the Ge(110) analyzer crystals have a resolution of better than 0.7 eV. In addition to this set of analyzers, a set of three Si(553) crystals was used to obtain Cu Kbeta" XES data. This was the second time this setup was used for Cu Kbeta" XES, and a resolution of better than 1 eV for these measurements was obtained. The RIXS and XES data from these measurements are being analyzed. Finally a newly purchased set of three Ge(111) analyzers was used in a study of range extended Mn EXAFS (beyond the Fe K edge) of the oxygen evolving complex of photosystem II. This experiment was performed at beam line 18ID at the Advanced Photon Source. We are planning to move the extended range experiments to SSRL when SPEAR3 is running at 500 mA.

这个子项目是许多研究子项目中利用 资源由NIH/NCRR资助的中心拨款提供。子项目和 调查员(PI)可能从NIH的另一个来源获得了主要资金， 并因此可以在其他清晰的条目中表示。列出的机构是 该中心不一定是调查人员的机构。 进一步开发了用于非弹性x射线散射和先进光谱测量(包括x射线发射光谱和位置选择性EXAFS光谱)的仪器。利用该装置在SSRL BL6-2上进行了首次共振非弹性X射线散射(RIXS)测量。一套三台Ge(110)分析仪被用来测量Fe K-α发射。用Si(111)晶体作为束线单色器，在6.4keV下测得总能量分辨率为1.1 eV。假设Si(111)晶体在6.4keV时的达尔文宽度为0.9 eV，这表明Ge(110)分析器晶体的分辨率优于0.7 eV。除了这套分析器外，还使用了一组三个Si(553)晶体来获得CuKbeta“XES数据，这是第二次使用这种装置来测量CuKbeta”XES，并获得了优于1 eV的分辨率。来自这些测量的RIXS和XES数据正在分析中。最后，用一套新购买的三台Ge(111)分析仪研究了光系统II的放氧复合体的射程扩展的Mn EXAFS(超出Fe K边)。这项实验是在先进光子源的光束线18ID上进行的。我们计划当SPEAR3以500 mA的速度运行时，将扩展范围的实验转移到SSRL。