COMMISSIONING OF A CRYSTAL ANALYZER FOR INELASTIC SCATTERING AND ADVANCED SPECTR

用于非弹性散射和高级光谱的晶体分析仪的调试

• 批准号: 7370626
• 负责人: UWE BERGMANN
• 金额: $ 2.79万
• 依托单位: STANFORD UNIVERSITY
• 依托单位国家: 美国
• 财政年份: 2006
• 资助国家: 美国
• 起止时间: 2006-03-01 至 2007-02-28
• 项目状态: 已结题
• 来源: https://reporter.nih.gov/project-details/7370626
• 关键词: COMMISSIONING; CRYSTAL; ANALYZER; INELASTIC; SCATTERING

This subproject is one of many research subprojects utilizing the resources provided by a Center grant funded by NIH/NCRR. The subproject and investigator (PI) may have received primary funding from another NIH source, and thus could be represented in other CRISP entries. The institution listed is for the Center, which is not necessarily the institution for the investigator. An instrument for high energy-resolution spectroscopy is beign developed, partly funded by the Resource. An initial set of crystal analyzers for inelastic x-ray scattering and advanced spectroscopic measurements (including x-ray emission spectroscopy and site-selective EXAFS) was commissioned on BL6-2 during the experimental run. The analyzer optics are selected based on the emission lines of interest. Currently, we have three Si(553) crystals with a 1000 mm radius of curvature. Using Si(111) crystals as beam line monochromator, a total energy resolution of ~1.6 eV was measured at 8.9 keV. Assuming a Darwin width of 1.3 eV for Si(111) crystals, this indicates that the Si(553) analyzer crystals have a resolution of better than 1 eV. This shows that the current BL6-2 optics configuration, together with the analyzer system we are developing, should allow for relatively high resolution measurements in this energy range. This particular set of analyzer crystals will be used for measurements of copper emission lines. Preliminary data on a series of copper model complexes in the in the Cu K?¿¿¿¿ XES cross over region have already been obtained, and indicate that this technique may provide new insights into metal-ligand binding modes.

该子项目是利用NIH/NCRR资助的中心赠款提供的资源的许多研究子项目之一。子项目和研究者（PI）可能从另一个NIH来源获得主要资金，因此可以在其他CRISP条目中表示。所列机构为中心，不一定是研究者所在机构。正在开发一种高能量分辨率光谱仪，部分资金来自资源。在实验运行期间，BL 6 -2上调试了用于非弹性X射线散射和高级光谱测量（包括X射线发射光谱和选址EXAFS）的初始晶体分析仪。基于感兴趣的发射线来选择分析仪光学器件。目前，我们有三个曲率半径为1000 mm的Si（553）晶体。用Si（111）晶体作束线单色器，在8.9keV能量下测得总能量分辨率约为1.6eV。假设Si（111）晶体的达尔文宽度为1.3 eV，这表明Si（553）分析晶体具有优于1 eV的分辨率。这表明，目前的BL 6 -2光学配置，加上我们正在开发的分析仪系统，应该允许在这个能量范围内进行相对较高的分辨率测量。这套特殊的分析晶体将用于测量铜发射线。 在Cu K中一系列铜模型络合物的初步数据？XES交叉区已经获得，并表明该技术可能提供新的见解金属配体结合模式。