Physical principles of electron beam characterization at nanoscale

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When working with nanoscale objects it is necessary to replace direct observation by human senses by microscopy. Transmission electron microscopy (TEM) looks "inside" materials similarly to X-rays looking "inside" people. In this sense it is complementary to scanning probe techniques such as STM and AFM. TEM experiments often allow quantitative interpretation at better than one nanometer spatial resolution. The applications of advanced TEM range from catalysts and semiconductor materials and devices to life science samples. The need to expand limits of electron microscopy is dictated by the necessity to provide Canada's researchers and industry with ongoing access to state-of-the-art quantitative characterization of nanomaterials. The goal of the electron microscopy research is to achieve and maintain world leadership and reputation in aspects of electron microscopy of interest to NINT research community and industrial partners. The aim of this proposal is to develop strong electron microscopy expertise which, together with NINT's state-of-the-art instrumentation, will continuously attract a wide range of external collaborations in nanoscience to NINT. In particular the EM research is focused on pushing the boundaries of electron holography for quantitative characterization of electrostatic and magnetic fields at resolution better than 1 nm, electron energy loss spectroscopy for chemical composition and bonding characterization of nanomaterials and interfaces and on cryomicroscopy of proteins and sub-cellular biological materials. The goals will be achieved by pursuing improved understanding of physical principles underlying data interpretation, by innovative experiment design and by building inexpensive hardware additions. Consequently the instrument capabilities will retain their cutting edge status for an extended period of time.