Exploring physical limits of electron beam characterization

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The importance of electron microscopy (EM) increases with the increasing importance of nanoscience and development of new nanomaterials. EM can provide quantitative information below single digit nanometer length scale. Cutting edge EM brings competitive advantage to application research and development with access to the newest EM analysis. The EM research program at NINT is focused on development of microscopy that can provide quantitative data on practical, radiation sensitive, samples. To improve our analytical capabilities, we further develop physics underlying electron energy loss spectroscopy (EELS) analysis, electron holography and Zernike phase plate imaging with electrons, electron tomography, cryo-TEM and nano-beam diffraction. Many industrial and academic clients and collaborators currently benefit from the expertize developed at NINT EM. NINT EM continuously attracts number of collaborations from top laboratories around the world further strengthening reputation of our laboratory. Most of our core research is funded by National Research Council / National Institute for Nanotechnology. The NSERC support serves primarily to retain the PhD student training aspect of the electron microscopy at NINT. The students will work on projects ranging from investigations of electron scattering and electron beam induced damage of solids to electron holography and valence loss EELS.