High performance microanalysis upgrades to field emission scanning electron microscope

场发射扫描电子显微镜的高性能微分析升级

• 批准号: 406259-2011
• 负责人: Bishop, DonaldPaul
• 金额: $ 5万
• 依托单位: Dalhousie University
• 依托单位国家: 加拿大
• 项目类别: Research Tools and Instruments - Category 1 (<$150,000)
• 财政年份: 2010
• 资助国家: 加拿大
• 起止时间: 2010-01-01 至 2011-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=472425
• 关键词: performance; microanalysis; upgrades; field; emission

The field emission scanning electron microscope (SEM) facility at Dalhousie University is part of the Institute for Research in Materials (IRM). It has provided imaging and analytical services to users from Atlantic Canada for over 7 years. To date, more than 400 HQP researchers in Materials Science, Physics, Engineering, Chemistry, Earth Sciences, Biology, and Medicine have utilized the SEM in conjunction with the attachments for energy dispersive X-ray spectroscopy (EDS) and electron back scatter diffraction (EBSD). The facility is currently accessed by 80 HQP within Dalhousie and the surrounding Atlantic Canada region on a regular basis. In many instances, it is the only regional means for them to advance their research and further their understanding of the innovative materials they create and test. Whereas the core unit itself is in exceptional working order, a number of the peripheral features are now in a state of disrepair. These items have recently begun to degrade at an alarming pace prompting frequent system shut downs that have invoked serious delays in HQP research and thousands of dollars in repair work. The issues at hand can be fully resolved with the purchase of several items that will replace the unreliable components and simultaneously enable major improvements in the quality, quantity, and nature of data that HQP can acquire from the system. One item is a replacement of the operating system and computer that runs the SEM. The second is a silicon drift detector (SDD) needed to replace our ailing Si(Li) detector. The SDD package is premised on the Oxford Instruments X-Max 80 detector. It can complete chemical analyses at exceptionally fast counting rates, is ideally suited for EDS work on delicate specimens (nano-materials, thin films), requires no liquid nitrogen during operation, and is virtually maintenance free. The final item is an Oxford Channel 5 ICDS structural database of crystalline materials. It is a natural extension to the other expenditures and will facilitate phase identification in complex materials. The applicant team endeavors to secure funding for these items on their own personal behalf and that of our entire SEM user community.

达尔豪西大学的场发射扫描电子显微镜(SEM)设施是材料研究所(IRM)的一部分。七年多来，它一直为加拿大大西洋地区的用户提供成像和分析服务。到目前为止，材料科学、物理、工程、化学、地球科学、生物和医学领域的400多名HQP研究人员已经将扫描电子显微镜与附件结合使用，用于能量色散X射线光谱(EDS)和电子背散射衍射(EBSD)。该设施目前由达尔豪西和周边大西洋加拿大地区的80名总部人员定期访问。在许多情况下，这是他们推进研究和加深对他们创造和测试的创新材料的理解的唯一地区性手段。虽然核心单元本身处于异常工作状态，但许多外围部件现在处于年久失修的状态。这些设备最近开始以惊人的速度退化，导致频繁的系统关闭，导致HQP研究严重延误，并导致数千美元的维修工作。手头的问题可以通过购买几个项目来完全解决，这些项目将替换不可靠的组件，同时使HQP可以从系统获取的数据的质量、数量和性质得到重大改进。其中一个项目是更换运行扫描电子显微镜的操作系统和计算机。第二个是硅漂移探测器(SDD)，需要用来取代我们病态的硅(Li)探测器。SDD包的前提是牛津仪器公司的X-Max 80探测器。它可以以极快的计数速率完成化学分析，非常适合对精细样品(纳米材料、薄膜)进行EDS工作，在操作过程中不需要液氮，而且几乎无需维护。最后一项是牛津第五频道ICDS晶体材料结构数据库。这是其他支出的自然延伸，将有助于确定复杂材料的阶段。申请者团队努力为这些项目争取资金，代表他们自己和我们整个SEM用户社区的利益。