In-Situ Nanoindentation Tester

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An in-situ nanoindentation tester is requested in this proposal to support on-going and future research programs of the applicants, which are heavily involved in synthesizing and testing of various nano-materials, including thin films, nanocrystalline coatings, and bulk nanocrystalline metal alloys. In particular, the equipment requested in this proposal will be mainly used for in-situ nano-indentation and nano-scratch test for mechanical characterization of nano-materials. For this purpose, the instrument will consist of an in-situ Scanning Probe Microscope (SPM, for surface topography examination) and a nanoindentation system with a hard tip that can operate in both vertical and lateral force modes for nanoindentation and nano-scratch tests, respectively.