STEM-in-SEM: A Tool For the High Throughput Analytical Characterization of Materials at the Nanoscale

STEM-in-SEM：纳米尺度材料高通量分析表征的工具

• 批准号: 472524-2015
• 负责人: Sinclair, Chadwick
• 金额: $ 4.73万
• 依托单位: University of British Columbia
• 依托单位国家: 加拿大
• 项目类别: Research Tools and Instruments - Category 1 (<$150,000)
• 财政年份: 2015
• 资助国家: 加拿大
• 起止时间: 2015-01-01 至 2016-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=577927
• 关键词: STEM; SEM; Tool; Throughput; Analytical

This proposal seeks funds for a scanning transmission electron microscopy (STEM) detector and ancillary equipment. This equipment will be used in conjunction with our existing high resolution field emission gun scanning electron microscope in the multidisciplinary AMPEL Electron Microscopy User Facility. This STEM-in-SEM detector, along with the associated mechanical noise cancellation system, will have a major impact on the ability of UBC researchers to study materials at the nanometric scale. As UBC is currently without an analytical transmission electron microscope, the proposed STEM-in-SEM detector will provide the only capacity at UBC for researchers to both observe and perform nanoscale chemical analysis on inorganic materials. This will greatly accelerate new developments in both carbon nanostructures for electronics as well as nanoscale precipitation control in structural alloys. It will also provide researchers at UBC a tool that can bridge, at higher throughput and lower cost, higher resolution experiments at specialized facilities such as the Canadian Centre for Electron Microscopy at McMaster University.

这项提议寻求资金，用于购买扫描透射式电子显微镜(STEM)探测器和辅助设备。该设备将与我们现有的高分辨率场发射枪扫描电子显微镜一起用于多学科的安佩尔电子显微镜用户设施。这种STEM-in-SEM探测器，以及相关的机械噪音消除系统，将对UBC研究人员在纳米尺度上研究材料的能力产生重大影响。由于UBC目前没有分析电子显微镜，拟议的STEM-in-SEM探测器将为UBC的研究人员提供唯一的能力，既可以观察无机材料，也可以对无机材料进行纳米级的化学分析。这将极大地加速电子用碳纳米结构以及结构合金中纳米级沉淀控制的新发展。它还将为UBC的研究人员提供一种工具，可以在麦克马斯特大学的加拿大电子显微镜中心等专门设施中以更高的吞吐量和更低的成本连接更高分辨率的实验。