STEM-in-SEM: A Tool For the High Throughput Analytical Characterization of Materials at the Nanoscale

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This proposal seeks funds for a scanning transmission electron microscopy (STEM) detector and ancillary equipment. This equipment will be used in conjunction with our existing high resolution field emission gun scanning electron microscope in the multidisciplinary AMPEL Electron Microscopy User Facility. This STEM-in-SEM detector, along with the associated mechanical noise cancellation system, will have a major impact on the ability of UBC researchers to study materials at the nanometric scale. As UBC is currently without an analytical transmission electron microscope, the proposed STEM-in-SEM detector will provide the only capacity at UBC for researchers to both observe and perform nanoscale chemical analysis on inorganic materials. This will greatly accelerate new developments in both carbon nanostructures for electronics as well as nanoscale precipitation control in structural alloys. It will also provide researchers at UBC a tool that can bridge, at higher throughput and lower cost, higher resolution experiments at specialized facilities such as the Canadian Centre for Electron Microscopy at McMaster University.