Topography, Morphology and Thermal Analyses for Semiconductor Radiation Detectors

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This Engage project seeks funding to support research partnership between the Company Redlen (Saanichton, British Columbia) and the research group led by Prof Clara Santato, in the Department of Engineering Physics at Polytechnique Montreal. Redlen is a leading manufacturer of high-resolution Cadmium Zinc Telluride (CZT) semiconductor radiation detectors for Nuclear Cardiology, CT Scanning, Baggage Scanning and Dirty Bomb detection. To further improve energy resolution and achieve better image quality and more precise radioactive isotope detection/identification, Redlen needs to advance the knowledge on the physicochemical properties of the surfaces of the CZT wafers. The need of Redlen to resolve simultaneously, at the nanoscale, the topographical, chemical and thermal properties of the CZT surface naturally calls for a close collaboration of Redlen with the team of Prof. Santato. This team has a recognized expertise in the research field of physical chemistry of electroactive and photoactive materials and has access to state-of-the-art equipment and infrastructure, in particular to an equipment unique in Canada, a near IR atomic force microscope with thermal capabilities. This Engage research project creates an unprecedented opportunity to generate new knowledge, at the nanoscale, on high performance materials, to improve the quality of the detection and imaging in cost-effective radiation-based medical and security imaging equipment produced by the Redlen Company.