Sample stabilization system for super-resolution microscopy

光学显微镜是应用最广泛的研究工具之一。由于衍射极限的限制，它的分辨率被限制在~250 nm。过去几年取得的突破克服了衍射障碍。超分辨率显微镜，如STORM、Palm和STED，使研究人员能够进行分辨率优于10纳米的光学成像。然而，所有研究人员都面临的一个基本障碍是，在图像采集时间(通常为5-10分钟)期间，无法将样品保持在纳米尺度上不动。由于温度梯度或机械运动导致的样品漂移很容易达到数百纳米甚至微米。样品位置的这种不确定性使得超分辨率图像不准确且不可重复。目前还没有一个商业系统能够完全解决这个问题。针对这一需求，我们开发了一种消除样品漂移的3D显微镜稳定系统。我们的系统将三维漂移限制在x-y平面上小于1 nm，在z轴上小于2.5 nm。在我们发明的基础上，发表了一篇研究论文，并于2015年2月在美国提交了临时专利申请。此市场评估的目标是验证技术的潜在市场规模、最终用户的需求以及他们购买产品的意愿/能力。

Optical microscopy is one of the most widely-used research tools. Because of the diffraction limit, its resolution has been limited to ~250 nm. Breakthroughs made in the past several years have overcome the diffraction barrier. Super-resolution microscopy, such as STORM, PALM, and STED, has enabled researchers to carry out optical imaging with a resolution better than 10 nm. However, one fundamental obstacle all researchers are facing is the inability to hold a sample immobile on the nm-scale during the image acquisition time, typically 5-10 min. Sample drift due to thermal gradients or mechanical motion is easily in the hundreds of nanometers or even microns. This uncertainty in the sample position renders the super-resolution images inaccurate and unrepeatable. Currently no commercial systems are capable of completely resolving this issue. In response to this need, we have developed a 3D microscope stabilization system to eliminate sample drift. Our system limits the 3D drift to less than 1 nm in the x-y plane and 2.5 nm in the z axis. On the basis of our invention, a research paper was published, and a provisional patent application was filed in the USA in February 2015. The goal of this market assessment is to validate the potential market size for the technology, the end-user need, and their willingness/ability to purchase the product.