growth and structure determination of thin films for future electronic technologies

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Many emerging or future technologies depend on the atomic level control of materials, and the optimization of such materials requires, in turn, an atomic level understanding of the materials properties. This is particularly true in applications related to microelectronics, where critical device performance depends on the detailed properties of materials, surfaces, and interfaces on length scales from individual atomic layers up to the sub micron scale. In this proposal, we will take advantage of a newly acquired low temperature scanning tunneling microscope (STM) to broaden the scope of our previous research on the atomic structure of surfaces and thin films to two areas of application.