Advanced Statistical Modeling and Optimization Technologies for Yield-Driven Design of High-Frequency Electronic Circuits

点击翻译按钮获取中文摘要

The objective of this research is to develop next generation technologies for statistical modeling and optimization of high-frequency electronic components and packages in wireless and wireline communication systems. With increasing functionality, complexity, signal speed and bandwidth in wireless and wireline communication systems, the design specifications for the building block components and subsystems become more stringent. This in turn makes the effects from unavoidable manufacturing tolerances and process uncertainties in components and subsystems more pronounced in the overall system performance, affecting production yield and posing challenges in design. Statistical modeling and yield optimization directly taking into account the uncertainties in parameters as part of the design process become important. However, conventional statistical modeling and yield optimization techniques that are mature enough for equivalent circuit based design are not effective for today’s electromagnetic (EM)/multiphysics-based design because of the prohibitive computational cost. A new statistical modeling and optimization paradigm is necessary to enable EM and multiphysics based yield-driven design. The proposed research will address these challenges.