Advanced Statistical Modeling and Optimization Technologies for Yield-Driven Design of High-Frequency Electronic Circuits

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The objective of this research is to develop next generation technologies for statistical modeling and optimization of high-frequency electronic components and packages in wireless and wireline communication systems. With increasing functionality, complexity, signal speed and bandwidth in wireless and wireline communication systems, the design specifications for the building block components and subsystems become more stringent. This in turn makes the effects from unavoidable manufacturing tolerances and process uncertainties in components and subsystems more pronounced in the overall system performance, affecting production yield and posing challenges in design. Statistical modeling and yield optimization directly taking into account the uncertainties in parameters as part of the design process become important. However, conventional statistical modeling and yield optimization techniques that are mature enough for equivalent circuit based design are not effective for today's electromagnetic (EM)/multiphysics-based design because of the prohibitive computational cost. A new statistical modeling and optimization paradigm is necessary to enable EM and multiphysics based yield-driven design. The proposed research will address these challenges.*******Built on top of our recent advances in statistical neuro-space mapping and cognition driven technologies for RF/microwave design, this research explores new frontiers in EM/multiphysics based statistical modeling and yield optimization. This research will develop new optimization algorithms exploiting fast parametric EM model with or without coarse engineering models, dramatically cutting the computational expenses of yield optimization of EM structures. The research will create unified parametric modeling algorithms for EM structures combining space mapping and knowledge-based neural network models. New dynamic statistical neuro-space mapping algorithm will be developed for statistical modeling of nonlinear devices covering the statistical behavior of both high- and low-frequency (such as trapping effects) responses. The research also aims to open a new frontier in modeling and design by extending EM-based statistical design to multiphysics-based statistical design. A new class of space mapping optimization algorithms with mapping between EM space and multiphysics space for microwave optimization will be introduced.*******The long term direction is a unified EM/multiphysics based methodology for fast and accurate statistical modeling and yield optimization for next generation high-frequency electronic design. The long-term impact will be faster design cycle, lower design cost, better design quality and increased manufacturing yield. It contributes to creating new knowledge and training of highly qualified technical personnel in areas of high-frequency electronic design.***