基于Sr-90/Y-90放射源，YAG透明陶瓷和单晶硅NIP器件的辐伏/光伏联合转换同位素电池中，高能电子辐射NIP器件并转换为电输出，其中，NIP器件长期辐射稳定性是电池长寿命的保障。但是低注量率高能电子长时间对单晶硅材料的辐射效应研究较为缺乏，且Sr-90/Y-90出射的β粒子具有能谱形式，不同的能量具有不同的损伤常数，想要使用加速老化实验对这种形式的辐射损伤进行评估较为困难。本项目拟通过能量沉积计算结合不同能量电子加速辐照实验及在线数据的采集来判断单能电子对能谱电子的模拟，通过多种活度的Sr-90/Y-90源原位辐照以及在线测量数据来揭示剂量率效应，以噪声测试，深能级瞬态谱，正电子湮灭谱和电子顺磁能谱等测量手段来表征单晶硅NIP器件中材料的缺陷，从而了解辐射损伤的机理及其演化行为，为辐伏/光伏联合转换同位素电池长期可靠性研究打下基础，也为其它高能电子的应用领域提供参考。

In a beta-photo-voltaic battery with Sr-90/Y-90,YAG transparent ceramic and c-Silicon NIP diode, energitic electrons interact with NIP diode. It is the radiation effect of NIP diode that decide the service period of battery. Radiation damage of c-Si NIP diode under such low flux,high energy,long time radiation of elctron is barely investigated, especially the energy of beta emitted from Sr-90/Y-90 source is a spectrum distribution which increase difficulty to evaluate radiation effect because electrons with different energy devote different radiation damage factor to c-Si NIP diode. This project will systematically analysis the deposited energy, microscopic structure damage and beta-photo-voltaic property damage of c-Si NIP diode between Sr/Y-90 radioactive source in situ radiation experiments and accelerated aging experiments. Based on the contastive analysis, we will try to set up the relationship between spectrum and monoenergy, also to evaluate equivalent performance under long term radiation from radioactive source and short term radiation from accelerator electrons. Besides, Noise-measuring system, Deep level transient spectroscopy, Electron spin resonance, Positron annihilation technology will be used in this project to get the microscopic structure change with different radiation condition, revealling the radiation damage mechanism and evolutionary process. This study will benifit us accumulating basic rule and data for long time reliability of beta-photo-voltaic battery and other field investigation with high energy electron.