薄膜微结构对基于共轭聚合物的有机光电转换器件的器件性能有很大的影响，因此研究退火（包括热退火和溶剂蒸汽熏蒸退火）这种薄膜微结构的有效的调控方法的机理十分重要。但是目前相应的原位测试平台与相关方法学研究还是空白，因此本项目拟在上海同步辐射光源衍射站搭建一套适用于共轭聚合物薄膜退火过程中微结构实时表征的二维掠入射X射线衍射测试平台，建立相关的测试与分析方法，并用这套平台初步研究共轭聚合物薄膜退火过程中微结构的变化机理，为薄膜微结构的调控提供新的方法与思路。

The study of mechanism of thermal annealing/solvent vapor annealing, which is an efficient method to control the microstructure of conjugated polymer thin film, is very important because of the huge influence of such microstructure on the performance of related electro-optic devices. However the corresponding in-suit characterization system and related methodology study are still unavailable. In this project we will set up an in-suit characterization system of microstructure of conjugated polymer thin films using synchrotron 2D grazing incident X-ray diffraction. Related measurement and analysis method will be also studied. After the set up, such system will be used to study the mechanism of annealing of conjugated polymer thin film, from which the new method and idea of controlling the microstructure will be achieved.