在极低温和强磁场下对超高真空中制备的低维样品进行原位的电子输运性质的测量是这方面科学家一直追求的重要方向，这样不仅可以对纳米线、超薄膜这样的纳米结构体系进行输运性质研究，也是研究新量子体系表面的特殊电导的迫切需要。但到目前为止世界上还没有这样的实验装置。本项目拟搭建一套原位微区四探针输运测量系统，以实现在超高真空中、在极低温与外加磁场下的高灵敏度的表面电导输运测量。此系统可应用于以半导体和绝缘体为衬底的各种薄膜与表面超结构。由于微区四探针测量对表面电导非常敏感，是研究拓扑绝缘体这些新量子态系统表面态、表面电导的最有效手段。该系统将可以获取这类新材料的电子自由程，弛豫时间，迁移率等与电子输运有关的参数，揭示零质量的二维电子气系统的电子强相关作用，电声耦合以及杂质引入的弱局域化效应等电子散射机理，为研究这类二维电子气系统的提供非常强有力的工具。

In-situ transport measurements on low dimensional structures at low temperature and high magnetic field is a long time dream for scientists in this area. This kind of measurement is urgently needed for novel quantum system and nano-structures, e.g., nano-wires and thin films. This project is aimed at developing a in-situ micro-four-probe transport measurement system, so that we can measure the surface conductance sensitively in UHV and at low temperature, high magnetic field. The system can be used for studying thin films on semiconductor/insulators. The micro-four-probe transport measurement is very sensitive to surface conductivity, it will be the most effective method for the topological surface states on topological insulators and new quantum systems.