斯格明子，一种受拓扑保护的新颖磁结构，是下一代超高密度磁存储的重要候选。然而，目前研究主要基于宏观输运测量，一方面难以确认斯格明子的存在，另一方面也无法准确获取斯格明子的大小、密度、调控行为等关乎实际应用的信息。针对以上问题，本项目拟通过自主研制的高灵敏成像磁力显微镜，对两个基于SrRuO3 的薄膜（1）“BaTiO3/SrRuO3/SrTiO3（BTO/SRO/STO）”超薄膜和（2）氦离子辐照SRO/STO薄膜中的斯格明子进行直接成像对比研究，阐明斯格明子产生机理，揭示斯格明子受温度、磁场、厚度等多物理作用调控下的动力学行为与调控机制的规律，并结合微磁学模拟获取斯格明子的大小、密度等关键信息, 为全面系统理解SRO薄膜中斯格明子的本征属性提供微观数据支撑，为基于斯格明子的氧化物自旋电子学的实现提供可能。

Magnetic skyrmion (skyrmion), a new topologically protected magnetic structure, is regarded as a promising candidate for next-generation ultra-high-density magnetic storage. However, current research on skyrmion is mainly based on macroscopic transport characteristics, which makes it difficult to identify the existence of skyrmion as well as to obtain accurate information about the size、density、and unique dynamic properties of skyrmion for practical applications. Based on these questions, this project is going to use a home-built high sensitivity magnetic force microscopy to direct observation of skyrmion in two SrRuO3-based thin films:（1）“BaTiO3/SrRuO3/SrTiO3（BTO/SRO/STO）” ultrathin films and (2) “Helium ion irradiation SRO/STO (He-SRO/STO) ” thin films. This research aims to clarify the generation mechanism of skyrmion and to investigate dynamic behaviors and control mechanisms of skyrmion under the influence of various physical conditions, namely, temperature、magnetic field、 and thickness. Besides, basic information about size, and density of the skyrmion will be given aided by micromagnetic simulation. In summary, this project can provide microscopic data for a comprehensive understanding of the intrinsic properties of skyrmion in SRO thin films and pave a way for the development of skyrmion-based oxide electronics.