课题基金基金详情
基于钳位电容交错互联的SiC-MOSFET串联均压拓扑及驱动端共模电流抑制策略
结题报告
批准号:
52007150
项目类别:
青年科学基金项目
资助金额:
24.0 万元
负责人:
张帆
依托单位:
学科分类:
电力电子学
结题年份:
2023
批准年份:
2020
项目状态:
已结题
项目参与者:
张帆
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中文摘要
器件串联技术可以有效地提升电力电子开关的电压等级。做为宽禁带半导体器件的代表,SiC-MOSFET器件由于开关速度快、寄生参数小等特点,导致串联均压控制的难度更大,且串联应用中产生的共模电流干扰更为显著。针对这些问题,本课题拟从以下三个方面展开研究:在拓扑层面,研究钳位电容交错互联型SiC-MOSFET串联均压拓扑结构及参数优化设计方法,以解决现有均压方案在高开关速度和高均压可靠性方面无法兼顾的矛盾;在控制层面,研究SiC-MOSFET串联拓扑的多目标协同控制策略,在完成均压目标的同时实现对串联器件dv/dt的在线控制;在驱动层面,研究SiC-MOSFET串联的驱动电流递增效应建模及其解决办法,以消除串联系统中共模电流的负面影响;综合以上三点,将形成一套完备的SiC-MOSFET串联均压电路拓扑理论及共模电流抑制策略,保障串联器件的可靠、高性能运行。
英文摘要
Series-connection technology could increase the voltage rating of power semiconductor switches. However, as wide-band-gap device, SiC-MOSFETs switch very fast and show very small parasitic parameters, so they are more vulnerable to transient unequal voltage sharing and common mode current interference when connected in series. In order to solve these issues, this project plans to conduct the research in the following three aspects. In the topology aspect, clamp-capacitor-interleaving topology for series-connected SiC-MOSFETs will be analyzed first to deal with the contradiction between fast switching and high reliability in conventional voltage balancing methods. In the control algorithm aspect, Multi-objective control strategy will be studied to both control the voltage of the clamp capacitors and optimize the dv/dt of the series connected SiC MOSFETs. In the gate drive circuit aspect, the gate drive current increasing phenomenon will be researched, and a solution will be proposed to overcome its effect on both voltage sharing and common mode current amplitude. With the combination of the mentioned research, a whole theory for topology theory and common mode current suppression method of series-connection of SiC-MOSFET can be obtained, which will lead to reliable and high performance operation of the series connected SiC-MOSFETs.
期刊论文列表
专著列表
科研奖励列表
会议论文列表
专利列表
DOI:10.1109/tie.2023.3303628
发表时间:2024-07
期刊:IEEE Transactions on Industrial Electronics
影响因子:7.7
作者:Mengjie Qin;Wenjie Chen;Jiaxuan Niu;Qingyuan Gao;Mowei Lu;Fan Zhang;Xu Yang;Stefan M. Goetz
通讯作者:Mengjie Qin;Wenjie Chen;Jiaxuan Niu;Qingyuan Gao;Mowei Lu;Fan Zhang;Xu Yang;Stefan M. Goetz
DOI:10.1109/tpel.2021.3090031
发表时间:2021-12
期刊:IEEE Transactions on Power Electronics
影响因子:6.7
作者:Chengzi Yang;Y. Pei;Laili Wang;Longyang Yu;Fan Zhang;B. Ferreira
通讯作者:Chengzi Yang;Y. Pei;Laili Wang;Longyang Yu;Fan Zhang;B. Ferreira
DOI:10.1109/jestpe.2023.3301738
发表时间:2023
期刊:IEEE Journal of Emerging and Selected Topics in Power Electronics
影响因子:5.5
作者:Qin Mengjie;Chen Wenjie;Ye Aizhen;Zhang Fan;Stephan M. Goetz;Yang Fengtao;Yu Zheyuan;Yang Xu
通讯作者:Yang Xu
DOI:10.1109/tpel.2022.3194960
发表时间:2022-12
期刊:IEEE Transactions on Power Electronics
影响因子:6.7
作者:Fan Zhang;Yu Ren;Xu Yang;Wenjie Chen;Huitao Wu
通讯作者:Fan Zhang;Yu Ren;Xu Yang;Wenjie Chen;Huitao Wu
DOI:10.1109/tpel.2022.3233725
发表时间:2023-04
期刊:IEEE Transactions on Power Electronics
影响因子:6.7
作者:Fan Zhang;Yuze Zheng;Xuan Zhang;Xu Yang;Wenjie Chen
通讯作者:Fan Zhang;Yuze Zheng;Xuan Zhang;Xu Yang;Wenjie Chen
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