Enhanced dechlorination of triclosan by hydrated electron reduction in aqueous solution
Enhanced dechlorination of triclosan by hydrated electron reduction in aqueous solution
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水溶液中水合电子还原强化三氯生脱氯
DOI:
10.1016/j.cej.2014.11.048
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发表时间:
2015-03
影响因子:
15.1
通讯作者:
Dong, Wenbo
中科院分区:
文献类型:
--
作者:
Wang, Xiaoning;Xue, Yicen;Li, Hongjing;Dong, Wenbo
In this study, different methods of electron beam (EB) irradiation and potassium ferrocyanide (K4Fe(CN)6) activated by simulated sunlight irradiation (λ⩾ 290 nm) were adopted to generate hydrated electron (eaq−), respectively. Steady-state and laser flash photolysis experiments were conducted to evaluate the feasibility of using eaq−reduction to enhance the dechlorination of TCS in aqueous solution. Under the EB irradiation, eaq−was proved to be an effective radical, and significant degradation of TCS was observed. Under simulated sunlight irradiation, TCS degradation efficiency within 60 min increased from 70.3% (without K4Fe(CN)6) to 100% ([TCS]0/[K4Fe(CN)6]0= 1/5), and the average dechlorination percentage after 2 h increased from 62.7% to 90.7%, respectively. The degradation of TCS in the presence of eaq−adhered to the apparent first-order kinetics, and the optimal rate constant (kp) was (1.54 ± 0.02) × 10−3s−1. Several enhanced dechlorination products were obtained and a primary reaction mechanism was proposed.
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影响因子:
8.8
作者:
Heidler, Jochen;Halden, Rolf U.
通讯作者:
Halden, Rolf U.
DOI:
10.1016/s1010-6030(03)00103-5
发表时间:
2003-05-30
影响因子:
4.3
作者:
Latch, DE;Packer, JL;McNeill, K
通讯作者:
McNeill, K
DOI:
10.1016/j.scitotenv.2013.03.060
发表时间:
2013-06
期刊:
The Science of the total environment
影响因子:
--
作者:
Xu Liu;S. Yoon;B. Batchelor;A. Abdel-Wahab
通讯作者:
Xu Liu;S. Yoon;B. Batchelor;A. Abdel-Wahab
DOI:
10.1016/j.jphotochem.2007.04.024
发表时间:
2007-09
影响因子:
4.3
作者:
P. Wong‐Wah‐Chung;S. Rafqah;G. Voyard;M. Sarakha
通讯作者:
P. Wong‐Wah‐Chung;S. Rafqah;G. Voyard;M. Sarakha
影响因子:
13.6
作者:
Bin Yang;G. Ying;Jian-Liang Zhao;Li-Juan Zhang;Yi-Xiang Fang;L. Nghiem
通讯作者:
Bin Yang;G. Ying;Jian-Liang Zhao;Li-Juan Zhang;Yi-Xiang Fang;L. Nghiem