Near-surface velocimetry using evanescent wave illumination
Near-surface velocimetry using evanescent wave illumination
复制标题
使用倏逝波照明的近表面测速
DOI：
10.1115/imece2003-55015
复制
发表时间：
2004
影响因子：
2.4
通讯作者：
K. Breuer
中科院分区：
文献类型：
--
作者：
Songwan Jin;Peter Huang;Jinil Park;J. Yoo;K. Breuer
全内反射测速仪（TIRV）用于测量微流控系统近壁区域的粒子运动。TIRV图像用入射激光脉冲的渐逝场照明，并且仅包含非常接近通道表面的颗粒。悬浮在水中的亚微米尺寸的荧光颗粒被用作种子颗粒，并与粒子跟踪测速（PTV）算法分析其图像，以提取有关表观滑移速度的信息。在相对低的剪切速率（小于2,500 s-1）下，观察到与剪切速率成比例的速度。发现在亲水性和疏水性表面上测量的速度之间的统计差异很小。结果表明，滑移长度，如果存在的话，是小于10 nm，但不确定性的照明领域的确切特征，防止在这个时候更准确的测量。提供数值模拟以帮助理解结果并深入了解导致实验观察到的分布的机制。与实验技术的准确性和实验结果的解释相关的问题也进行了讨论。
Total internal reflection velocimetry (TIRV) is used to measure particle motion in the near-wall region of a microfluidic system. TIRV images are illuminated with the evanescent field of an incident laser pulse and contain only particles that are very close to the channel surface. Sub-micron-sized fluorescent particles suspended in water are used as seed particles and their images are analyzed with a particle tracking velocimetry (PTV) algorithm to extract information about apparent slip velocity. At relatively low shear rates (less than 2,500 s-1), a velocity proportional to the shear rate was observed. The statistical difference between velocities measured over hydrophilic and hydrophobic surfaces was found to be minimal. The results suggest that the slip length, if present, is less than 10 nm, but uncertainty regarding the exact character of the illumination field prevents a more accurate measurement at this time. Numerical simulations are presented to help understand the results and to provide insight into the mechanisms that result in the experimentally observed distributions. Issues associated with the accuracy of the experimental technique and the interpretations of the experimental results are also discussed.
全内反射荧光：在细胞生物物理学中的应用。
影响因子：
7.7
作者：
Thompson,NL;Lagerholm,BC
通讯作者：
Lagerholm,BC
影响因子：
14
作者：
Burmeister, JS;Olivier, LA;Truskey, GA
通讯作者：
Truskey, GA