Morphology and orientation of iron oxide precipitates in epitaxial BiFeO3 thin films grown under two non-optimized oxygen pressures

Morphology and orientation of iron oxide precipitates in epitaxial BiFeO3 thin films grown under two non-optimized oxygen pressures
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两种非优化氧压下生长的外延 BiFeO3 薄膜中氧化铁沉淀的形态和取向

DOI:
10.1080/14786435.2010.515261
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发表时间:
2010-09
影响因子:
1.6
通讯作者:
Ma, X. L.
Ma, X. L.
中科院分区:
材料科学3区
文献类型:
--
作者:
Wang, X.;Lu, H. B.;Mi, S. B.;Zhu, Y. L.;Wang, C.;Ma, X. L.

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采用激光分子束外延技术在SrRuO 3缓冲的SrTiO 3(001)衬底上外延生长了BiFeO 3多铁性薄膜,并利用透射电子显微镜(TEM)对两种非优化氧压下BiFeO 3薄膜的微结构进行了表征。结果表明,在1 Pa和0.3Pa的氧压下生长的薄膜中,BiFeO 3基体中含有第二相。高角环形暗场成像、元素分布和成分分析结合选区电子衍射表明,寄生相主要为反铁磁α-Fe 2 O3。高分辨透射电子显微镜证实,α-Fe 2 O3颗粒半相干地嵌入BiFeO 3薄膜中。在0.3Pa下生长的BiFeO_3薄膜中,除了α-Fe_2 O_3相外,还发现了铁磁性Fe_3 O_4相,并在薄膜/衬底界面附近聚集。在我们的异质外延系统中,非常低的密度失配位错观察到的BiFeO 3和SrRuO 3层之间的界面,这意味着它们的失配应变可以通过形成的第二相缓解。利用X射线光电子能谱,它被发现,铁存在于这些薄膜中的+3氧化态。根据薄膜生长条件讨论了第二相的可能形成机制。
Microstructures of multiferroic BiFeO3 thin films epitaxially grown on SrRuO3-buffered SrTiO3 (001) substrates by laser molecular-beam epitaxy under two non-optimized oxygen pressures were characterized by means of transmission electron microscopy. The results showed that the films grown under oxygen pressures of 1 Pa and 0.3 Pa contain a secondary phase embedded in the BiFeO3 matrix. High-angle annular dark-field imaging, elemental mapping and composition analysis in combination with selected area electron diffraction revealed that the parasitic phase is mainly antiferromagnetic α-Fe2O3. The α-Fe2O3 particles are semi-coherently embedded in the BiFeO3 films, as confirmed by high-resolution transmission electron microscopy. In addition to the α-Fe2O3 phase, ferromagnetic Fe3O4 precipitates were found in the BiFeO3 films grown under 0.3 Pa and shown to accumulate in areas near the film/substrate interfaces. In our heteroepitaxy systems, very low density misfit dislocations were observed at the interfaces between the BiFeO3 and SrRuO3 layers implying that their misfit strains may be relieved by the formation of the secondary phases. Using X-ray photoelectron spectroscopy it was found that Fe exists in the +3 oxidation state in these films. The possible formation mechanisms of the secondary phases are discussed in terms of film growth conditions.
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