High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach
High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach
复制标题
聚合物的高速动态模式原子力显微镜成像：自适应多环模式方法
DOI：
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发表时间：
2017
影响因子：
3.1
通讯作者：
Q. Zou
中科院分区：
文献类型：
--
作者：
Juan Ren;Q. Zou
在实验中，通过对三个差异很大的非均相聚合物样品成像来测试和评估自适应多回路模式(AMLM)成像以显著提高(超过一个数量级)轻击模式(TM)成像的速度。已经证明，AMLM成像通过一套先进的控制技术相结合，有望实现高速动态模式原子力显微镜成像。然而，AMLM在各种成像应用中的性能、可用性和健壮性还有待评估。在这项工作中，包括PS-LDPE样品、SBS样品和Celgard样品在内的三个基准聚合物样品分别在25 Hz和20 Hz的高速下使用AMLM技术进行了特征尺寸和刚度两个数量级的成像。将获得的图像与以1赫兹和2赫兹的扫描速度进行TM成像的图像进行比较，结果表明，25赫兹和20赫兹的AMLM成像的质量与1赫兹的TM成像的质量相当，而针尖-样品的相互作用力明显小于2赫兹的TM成像的质量。
Adaptive multiloop-mode (AMLM) imaging to substantially increase (over an order of magnitude) the speed of tapping-mode (TM) imaging is tested and evaluated through imaging three largely different heterogeneous polymer samples in experiments. It has been demonstrated that AMLM imaging, through the combination of a suite of advanced control techniques, is promising to achieve high-speed dynamic-mode atomic force microscopy imaging. The performance, usability, and robustness of the AMLM in various imaging applications, however, is yet to be assessed. In this work, three benchmark polymer samples, including a PS–LDPE sample, an SBS sample, and a Celgard sample, differing in feature size and stiffness of two orders of magnitude, are imaged using the AMLM technique at high-speeds of 25 Hz and 20 Hz, respectively. The comparison of the images obtained to those obtained by using TM imaging at scan rates of 1 Hz and 2 Hz showed that the quality of the 25 Hz and 20 Hz AMLM imaging is at the same level of that of the 1 Hz TM imaging, while the tip–sample interaction force is substantially smaller than that of the 2 Hz TM imaging.
影响因子：
4
作者：
Huang, Peng;Andersson, Sean B.
通讯作者：
Andersson, Sean B.