Upgrading of the Linear-type Pulsed-Laser-Time-of-Flight Atom Probe Field Ion Microscopes

线型脉冲激光飞行时间原子探测器FIM是一种质量和离子动能分析仪，具有检测单离子的灵敏度。它可以用来对固体表面进行逐层原子的化学分析，也可以用来测量离子动能分布。在离子反应速率测量中，其分辨率为1~2ppm/10万，时间分辨率优于20fs。它已被用于各种材料的原子尺度表面和界面成分分析，以及研究受激脱附、气-表面相互作用和离子反应等过程中原子和团簇离子的形成，是一种独特的原型系统。

Linear-type Pulsed Laser Time-of-Flight Atom Probe FIM is a mass and ion kinetic energy analyzer with sensitivity to detect single ions. It can be used for the chemical analysis of solid surfaces, atomic layer by atomic layer, and can also be used to measure ion kinetic energy distributions. It has a resolution of 1 to 2 parts in 100,000 and a time resolution of better than 20 fs in ion reaction rate measurements. It has been used for atomic scale surface and interface compositional analysis of various materials, and to study atomic and cluster ion formation in stimulated desorptions, gas-surface interactions, and ion reactions, etc. It is a unique prototype system.