PYI: Millimeter Wave and Microwave Remote Sensing

随机介质对电磁波的散射在遥感、目标识别等许多领域都具有重要意义。尽管关于随机介质中波的传播和散射的研究已经取得了长足的进展，但毫米波和微波区的后向散射增强效应等问题仍有待解决。为了了解电磁波与介质的相互作用，在受控环境下获得实验数据是很重要的。我们建议使用已知统计特性的随机介质在毫米波和微波区域进行仔细控制的实验。在表面散射研究中，我们将构建已知平均高度和相关距离的表面，并测量双基地和后向散射截面。我们将仔细研究粗糙表面对后向散射的增强效应。在成像研究中，我们将建立一个特殊的小室，并研究不同颗粒特征和分布的重建图像质量。该项目将加深我们对电磁波如何被随机介质散射的理解，并将在微波、毫米波和亚毫米波遥感中具有重要的实际应用。

Electromagnetic wave scattering by random media is important for many areas including remote sensing and target identification. Although considerable progress has been reported on the wave propagation and scattering in random media, there are many unanswered problems including the backscattering enhancement effect in the millimeter wave and microwave regions. To understand the interaction of the electromagnetic wave with medium, it is important to have experimental data obtained under controlled environments. We propose to conduct the carefully controlled experiments using random media of known statistical characteristics in the millimeter wave and microwave regions. In the surface scattering study we will construct surfaces of known mean heights and correlation distances and measure both bistatic and backscattering cross-sections. The backscattering enhancement effect by rough surface will be carefully investigated. In the imaging study we will build a special chamber and investigate the reconstructed image quality for different particle characteristics and distributions. The proposed project will enhance our understanding of how the electromagnetic wave is scattered by random media, and will have important practical applications in the microwave, millimeter wave, and sub-millimeter wave remote sensing.