Development of an Undergraduate High Speed Microelectronics Testing Laboratory at Florida A&M University.

该项目为FAMU/FSU工程学院电气工程专业本科生建立了一个超高速集成电路（VHSIC）测试实验室。本实验室通过一系列涵盖功能测试和参数测试基本原理的实验，为高年级学生提供实用的VHSIC测试方法。该实验室是本科微电子专业的补充，包括固态器件、数字和模拟集成电路设计以及超大规模集成电路的计算机辅助设计。利用新设备，学生们研究了属于逻辑家族的高速微电子器件的开关特性，如发射体耦合逻辑（ECL）、高速互补金属氧化物半导体（HCMOS）和砷化镓（GaAs）金属半导体场效应晶体管（MESFET）。电气工程专业的学生完成一系列的实验室实验，可以全面了解高速集成电路

This project establishs a very-high-speed integrated circuit (VHSIC) testing laboratory for undergraduate electrical engineering students at the FAMU/FSU College of Engineering. This laboratory provides practical testing methodologies of VHSIC for senior-level students through a series of experiments which cover the fundamentals of functional and parametric testing. The laboratory supplements the undergraduate Microelectronics Program which includes courses in solid-state devices, digital and analog IC design, and the computer aided- design (CAD) of very large scale integration (VLSI) circuits. With the new equipment, the students study the switching characteristics of high-speed microelectronic devices belonging to logic families such as emitter-coupled logic (ECL), high- speed complementary-metal-oxide-semiconductor (HCMOS), and gallium arsenide (GaAs) metal-semiconductor field-effect transistors (MESFET). Electrical engineering majors completing the sequence of laboratory experiments gain a comprehensive knowledge of high-speed IC