Acquisition of Instrumentation for Surface Analysis of Engineered Materials

该项目是为捐赠给该大学的扫描俄歇微探头和X射线光电子能谱仪的控制电子设备的升级和采购。这将对该大学的几个不同的研究小组产生有益的影响，并允许许多其他人从该设施中受益。将利用该仪器的研究项目有铁电薄膜的研究、结构陶瓷的力学研究、Si-SiO_2金属器件结构的分析、等离子体刻蚀的研究、高温超导薄膜和块体材料的电子材料研究。

This project is for the upgrade and acquisition of control electronics for a scanning Auger microprobe and X-ray photoelectron spectrometer that was donated to the university. This will have a beneficial effect on several different research groups at the university and allow many others to benefit from the facility. Examples of research projects that will make use of this instrument are investigations of ferroelectric films, mechanical studies of structural ceramics, analysis of Si-SiO2-metal device structures, investigations into plasma etching, electronic materials studies examining high-Tc superconducting thin film and bulk materials.