课题基金 / 基金详情

Acquisition of a Field Emission Gun Scanning Electron Microscope for Electron Channelling Contrast Imaging

Acquisition of a Field Emission Gun Scanning Electron Microscope for Electron Channelling Contrast Imaging
获取用于电子通道对比成像的场发射枪扫描电子显微镜
批准号:
9302040
负责人:
Martin Crimp
金额:
$16.85万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
1993
资助国家:
美国
项目状态:
已结题
起止时间:
1993-08-15 至 1995-01-31

项目摘要

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中文摘要
翻译
9302040压接 建议购买一台配备数字图像处理的场发射枪扫描电子显微镜,专门用于支持材料工程研究。 该设备将配备电子通道对比成像(ECCI)成像系统,目前正在与国家科学基金会青年研究者奖一起建造。 配备ECCI系统的FEG-SEM将是美国第一个此类设备,将用于几个需要微晶分析的研究项目,但这是传统透射电子显微镜(TEM)无法实现的,特别是: 本征脆性材料,包括金属间化合物合金,将使用大量样品原位变形,以确定在裂纹尖端区域和附近的位错生成和运动的性质进行检查。 其他研究项目也将使用ECCI能力进行广泛的材料研究,包括聚合物基复合材料的微观结构形态,金属间基复合材料和顺应层涂层的界面表征,以及断裂表面的损伤累积研究。 此外,FEG SEM比传统的W和LaB 6电子源SEM具有优势,例如更高的分辨率(1.5 nm)以及在低电压下检查非导电材料而无需施加导电涂层的能力。 材料科学与力学系和密歇根州立大学的许多研究人员将利用这些优势来加强他们的材料研究。 ***
英文摘要
9302040 Crimp It is proposed to purchase a field emission gun scanning electron microscope (FEG SEM) equipped with digital image processing which will be dedicated to support research in materials engineering. This equipment will be fitted with a electron channelling contrast imaging (ECCI) imaging system currently being constructed in conjunction with a National Science Foundation Young Investigator Award. The FEG-SEM equipped with the ECCI system, which will be the first facility of its type in the United States, will be used for several research projects which require microcrystalline analysis, but are not possible with conventional transmission electron microscopy (TEM), in particular: Intrinsically brittle materials, including intermetallic alloys will be examined using bulk samples deformed in-situ to determine the nature of the dislocation generation and motion at and near the crack tip zone. Other research programs will also use the ECCI capability for a wide range of materials investigations including microstructure morphologies in polymer matrix composites, interfacial characterization of intermetallic matrix composites and compliant layer coatings, and damage accumulation studies at fracture surfaces. Additionally, the FEG SEM has advantages over conventional W and LaB6 electron source SEMs, such as greater resolutions (1.5 nm) and the ability to examine non-conducting materials at low voltages without the need to apply a conductive coating. Numerous researchers throughout the Department of Materials Science and Mechanics, and Michigan State University will use these advantages to enhance their materials research. ***
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FIB Based Tomography of Dislocation Structures using Channeling Imaging
  • 批准号:
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