Detection and Imaging of Nanoscale Defects

9402599吉德利一个跨学科的研究计划将进行，结合了众所周知的缺陷灵敏度的正电子技术与国家的最先进的正电子束技术，以检测和成像的早期阶段的微观结构损伤在广泛的工程材料，传统的技术是不够的。 无法表征缺陷演变的纳米尺寸尺度代表了一个主要的缺失环节，在许多工程材料的合成到失效的生命周期的基础知识。 如果材料科学家能够测量从合成到失效的损伤的微观结构演变，他们将大大有助于改善材料的强度和耐久性，耐磨性和耐腐蚀性，环境相容性和制造成本效益等性能。 ***

9402599 Gidley An interdisciplinary research program will be undertaken that combines the well known defect sensitivity of positron techniques with state-of-the-art positron beam technology in order to detect and image the early stages of microstructural damage in a wide range of engineering materials where traditional techniques are not adequate. The inability to characterize defect evolution on the nanometer size scale represents a major missing link in the fundamental knowledge of the synthesis-to-failure life cycle of many engineering materials. If materials scientist can measure the microstructural evolution of damage from synthesis to failure they will be greatly facilitated in improving such material properties as strength and durability, wear and corrosion resistance, environmental compatibility, and fabrication cost effectiveness. ***