VLSI Interconnection Networks

这项研究是关于VLSI互连网络的分析技术。预测VLSI电路中的电容效应的方法，特别是圆角处的电容效应，正在使用渐近展开进行研究。其次，对确定片上非线性网络伏安特性的方法进行了评估。方法是将每个互连网络建模为在其末端连接在一起的三个终端网络的级联。每个级联都可以用一个非线性算子进行数学描述。正在开发计算效率高的分析技术。

This research is on techniques for analysis of VLSI interconnect nets. Methods for predicting capacitance effects in VLSI circuitry, especially at rounded corners, are being investigated using asymptotic expansions. Secondly, methods to determine the voltage-current regime of nonlinear networks on a chip are being assessed. The approach is to model each interconnection network as a cascade of three terminal networks connected together at their ends. Each cascade can be described mathematically by a nonlinear operator. Computationally efficient analysis techniques are being developed.