Low Energy Ion Scattering and Scanning Tunneling Microscope Studies of the Nucleation and Growth of Islands on Surfaces
Low Energy Ion Scattering and Scanning Tunneling Microscope Studies of the Nucleation and Growth of Islands on Surfaces
批准号:
9521392
负责人:
R. Stanley Williams
金额:
$27.0万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
1996
资助国家:
美国
项目状态:
已结题
起止时间:
1996-07-01 至 1999-06-30
中文摘要
小行星9521392威廉姆斯 将研究金属和类金属岛(Ni,Ag,In,Sn,Sb和Te)在半导体表面(Si)上的成核和生长现象。 飞行时间低能离子散射技术将用于测量材料沉积过程中表面岛的覆盖率,以获得动力学信息。扫描隧道显微镜(STM)将提供空间信息,如形状,大小和密度的岛屿,这可以与系统的热力学性质。实验数据将与计算机模拟进行比较,以确定生长机制和物理参数,特别是表面扩散常数和线张力为不同的吸附。 选择了具有广泛特性和行为的材料。STM还将提供有关岛的电子性质的尺寸依赖性和所支持的团簇的独特性质的信息。 本研究的最终目标是了解成核和生长的动力学和热力学过程,以便通过控制沉积参数(如通量、注量和衬底温度)来指导形成优化的点、线和/或平面结构。所选材料具有广泛的属性和行为。飞行时间低能离子散射技术将提供表面覆盖的信息 在材料沉积期间形成岛, 获得 动态信息扫描隧道显微镜(STM)将被用来研究空间信息,如形状,大小和密度的岛屿,这可能与系统的热力学性质。 实验数据将与计算机模拟数据进行比较,以确定 对不同吸附物的生长机制和物理参数,特别是表面扩散常数和线张力的研究,也将提供岛的电子性质与尺寸的关系以及负载团簇的独特性质的信息。 ***
英文摘要
9521392 Williams The phenomena of nucleation and growth of metals and metalloid islands (Ni, Ag, In, Sn, Sb, and Te), on semiconductor surfaces (Si) will be investigated. Techniques of Time-of Flight Low Energy Ion Scattering will be used to measure the coverage of the surface islands during material deposition to obtain kinetic information. Scanning Tunneling Microscopy (STM) will provide spatial information such as shape, size and densities of the islands, which can be related to thermodynamic properties of the system. The experimental data will be compared with computer simulations to determine growth mechanisms and physical parameters, especially surface diffusion constants and line tensions for different adsorbates. Materials with a broad range of properties and behaviors have been selected. STM will also provide information on the size dependence of the electronic property of the islands and the unique properties of supported clusters. %%% The ultimate objective in this research is to understand the kinetic and thermodynamic processes of nucleation and growth so that the formation of an optimized structure of dots, lines, and/or planes can be guided through control of deposition parameters such as flux, fluence and substrate temperature. The selected Materials have a broad range of properties and behaviors. Techniques of Time-of Flight Low Energy Ion Scattering will provide information on the coverage of the surface islands during material deposition to obtain kinetic information. Scanning Tunneling Microscopy (STM) will be used to study spatial information such as shape, size and densities of the islands, which can be related to thermodynamic properties of the system. The experimental data will be compared with computer simulations data to determine growth mechanisms and physical parameters, especially surface diffusion constants and line tensions for different adsorbates STM will also p rovide information on the size dependence of the electronic property of the islands and the unique properties of supported clusters. ***
期刊论文(0)
专著(0)
科研奖励(0)
会议论文
Symposium: Materials Research at the Crossroads of Physical and Solid-State Chemistry; American Chemical Society National Meeting; Washington, DC; August 21-26, 1994
-
批准号:9419688
-
项目类别:Standard Grant
-
资助金额:$0.38万
-
财政年份:1994
-
负责人:R. Stanley Williams
-
依托单位:
Surface Crystallography from Backscattering and Recoiling of1-15keV Ions and Atoms
-
批准号:9213669
-
项目类别:Continuing Grant
-
资助金额:$27.0万
-
财政年份:1992
-
负责人:R. Stanley Williams
-
依托单位:
Surface Crystallography by Low-Energy Ion Scattering
-
批准号:8820391
-
项目类别:Continuing Grant
-
资助金额:$25.84万
-
财政年份:1989
-
负责人:R. Stanley Williams
-
依托单位:
Ion-Scattering Spectroscopy for Near-Surface Crystallography(Materials Research)
-
批准号:8521663
-
项目类别:Continuing Grant
-
资助金额:$22.36万
-
财政年份:1986
-
负责人:R. Stanley Williams
-
依托单位:
Ion-Scattering Spectroscopy for Surface Structure Analysis (Materials Research)
-
批准号:8204858
-
项目类别:Continuing Grant
-
资助金额:$27.84万
-
财政年份:1982
-
负责人:R. Stanley Williams
-
依托单位:
国内基金
海外基金
度量测度空间上基于狄氏型和p-energy型的热核理论研究
-
批准号:QN25A010015
-
项目类别:省市级项目
-
资助金额:--
-
批准年份:2025
-
负责人:高晋
-
依托单位: