Surface Crystallography by Low-Energy Ion Scattering

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The objectives of this research are to determine the structures of the surfaces of various thin-film electronic materials using the techniques of low-energy ion scattering (LEIS) and scanning tunneling microscopy (STM). Systems to be studied include: monolayer films of ferromagnetic iron and nickel on silver(001) surfaces, thin heteroepitaxial films of copper-chlorine on silicon(111), the chemical interaction of gold atoms with gallium-arsenic(110), and the gold-catalyzed oxidation of silicon surfaces. The two complementary techniques will be employed to construct accurate atomic resolution models of these systems and the substrates on which they are supported. A new mathematical algorithm will be developed for calculating the angular distributions of low-energy particles scattered from solid surfaces. The ion scattering apparatus will be modified to permit time-of-flight detection of scattered ions and neutrals. This will facilitate study of charge exchange mechanisms on an attosecond time scale between ions and surfaces.