CISE Research Instrumentation: Instrumentation for Experimental Prototyping of RF Low-Power Microsystems

9818316Shenai， krishna伊利诺伊大学芝加哥分校（UIC）CISE研究仪器：RF低功耗微系统的实验原型该研究仪器支持以下研究项目：-低功耗RF器件和技术的计算机辅助设计（CAD）工具和建模，-低功耗RF微系统的电路和架构，- RF CMOS技术的开发和优化，以及-电子可视化（EV）和虚拟现实（VR）的应用。为了支持上述项目，该奖项将资助伊利诺伊大学芝加哥分校电气工程和计算机科学系购买一个探测站、一个精密参数分析仪、DD系统电源、一个测试系统和混合信号测试系统。该项目所需的设备将使通信和逻辑射频微系统的基础和应用研究成为可能。首先，在技术层面，需要改进器件表征和建模。现有的数字模型牺牲了小信号的精度，并且在参数提取中需要大量的曲线拟合。我们的方法采用参数技术来解释反射和互连寄生。在优化和开发深亚微米范围内的器件时，hp4156b的分辨率是必要的。其次，在系统层面，越来越多的混合信号功能集成对信号完整性提出了挑战，互连、基板和设备内部都会产生噪声。检测这些皮秒瞬变需要具有宽带宽和低噪声的设备。E2900A作为刺激源和54616TC作为监视器的组合将实现信号退化的实时检测。HP电源将为低于1v的设备操作提供非常干净的偏置。Cascade Summit射频探测站是测试环境的基础，可以在不受封装寄生影响的情况下对器件特性和信号完整性进行晶圆上测量。HP-IB接口将自动化测量过程，以更有效地使用设备。

9818316Shenai, KrishnaUniversity of Illinois at Chicago (UIC)CISE Research Instrumentation: Experimental Prototyping of RF Low-Power MicrosystemsThis research instrumentation enables research projects in:- Computer Aided Design (CAD) Tools and Modeling of Low-Power RF Devices and Technologies,- Circuits and Architectures of Low-Power RF Microsystems,- RF CMOS Technology Development and Optimization, and- Application of Electronic Visualization (EV) and Virtual Reality (VR).To support the aforementioned projects, this award contributes to the purchase of a probe station, a precision parameter analyzer, DD system power supply, a test system, and mixed-signal test systems by the Department of Electrical Engineering and Computer Science at the University of Illinois-Chicago.The equipment requested in this project will enable fundamental and applied research in RF microsystems for communications and logic. First, at the technology level, is the need for improved device characterization andmodeling. Existing digital models sacrifice small-signal accuracy and require extensive curve-fitting in parameter extraction. Our approach applies parameter techniques to account for reflections and interconnect parasitics. In optimizing and developing devices in the deep submicron regime, the resolution of the HP 4156B is necessary. Second, at the systems level, increasing mixed-signal functional integration is posing challenges to signal integrity, with noise contributions occurring in interconnects, the substrate, and within devices. Detection of these picosecond transients requires equipment with a wide bandwidth and low noise. The combination of the E2900A as a stimulus source and the 54616TC as a monitor will enablereal-time detection of signal degradation. HP power supplies will provide extremely clean biasing for sub-1V device operation. The Cascade Summit RF probe station is the foundation of the test environment, enabling on-wafer measurement of device characteristics and signal integrity, free from package parasitics. The HP-IB interfaces will automate the measurement process for more efficient use of the equipment.