Imaging Electronic and Photonic Processes in Nanostructured Interfaces

近场扫描光学显微镜在这个由分析和表面化学计划支持的研究项目中使用，以获得有机薄膜形态与其物理性质之间关系的信息。Barbara教授和他在德克萨斯大学奥斯汀分校的同事们解决了有机薄膜材料中电荷注入、电荷迁移和能量迁移的问题，并应用于有机发光二极管和相关器件。在之前的奖励期间进行的方法开发导致了现在专注于理解这些材料中能量迁移的空间范围以及层中能量相互作用的本质的方法。从这些研究中获得的信息对设计和制造最先进的光电器件是有用的。为了了解有机薄膜发光器件和相关光电材料的工作原理，必须获得薄膜中物理过程和形态的高分辨率空间信息。本研究项目使用近场扫描探针显微镜的方法开发的私家侦探来检查这些问题。这项研究的信息显然适用于电子和光子器件的制造问题。

Near field scanning optical microscopy is used in this research project supported by the Analytical and Surface Chemistry Program to obtain information on the relationship between the morphology of organic thin films and their physical properties. Professor Barbara and his colleagues at the University of Texas-Austin address issues of charge injection, charge migration, and energy migration in organic thin film materials with applications in organic light emitting diodes and related devices. Method development carried out in the previous award period resulted in approaches which are now focussed on understanding the spatial extent of energy migration in these materials, and the nature of energetic interactions in the layers. Information obtained from these studies is useful in the design and fabrication of state of the art optoelectronic devices. In order to understand the operation of organic thin film light emitting devices, and related optoelectronic materials, high resolution spatial information about physical processes and morphology in the films must be obtained. This research project uses near field scanning probe microscopic methods developed by the P.I. to examine these questions. Information from this research is clearly applicable in electronic and photonic device fabrication problems.