Participant Support for International Field Emission Symposium: 2000, Pittsburgh,PA, July 23-29, 2000

0084702 Seidman该提案要求提供参与者支持费用（5，000美元），以使10名年轻科学家（博士）及博士后研究生），出席于二零零零年七月二十三日至二十九日在匹兹堡大学举行的二零零零年国际场致发射研讨会。IFES-2000侧重于场发射显微镜、原子探针显微镜和三维原子探针显微镜的科学和技术用途，以研究各种问题。所涉及的主要议题是：（1）场致发射：过程和理论;（2）新方法和仪器;（3）液态金属离子源;（4）表面科学中的扫描隧道显微镜/原子力显微镜和场离子显微镜;（5）表面科学、氧化和纳米结构;（6）原子探针技术;（7）原子探针显微分析和材料科学;（8）真空微电子学。受邀演讲的暂定名单包括来自日本、德国、约旦、瑞典、英国、法国、比利时和美国的科学家。IFES研讨会汇集了利用场发射，场离子，原子探针场离子和/或三维原子探针场离子显微镜进行部分或全部研究工作的科学家。IFES专题讨论会的独特之处在于，它是唯一一个每一到两年将这一折衷科学家群体聚集在一起的专题讨论会。重点是如何使用这些工具来解决广泛的重大物理和技术问题。这次研讨会对使用这些实验技术的研究人员很重要，因为它是唯一一次主要关注这些研究工具及其在广泛的物理问题中的应用的会议。

0084702SeidmanThis proposal is a request for participant support costs ($5,000) that will enable ten young scientists (Ph.D. and post-doctoral students) to attend the International Field-Emission Symposium (IFES) 2000 at the University of Pittsburgh during July 23-29, 2000. IFES-2000 focuses on both the scientific and technological uses of field-emission microscopy, atom-probe microscopy, and three-dimensional atom-probe microscopy for studying a wide range of problems. The major topics covered are: (1) field emission: processes and theory; (2) new methods and instrumentation; (3) liquid metal ion sources; (4) scanning tunneling microscopy/atomic force microscopy and field- ion microscopy in surface science; (5) surface science, oxidation, and nanostructures; (6) atom-probe techniques; (7) atom-probe microanalysis and materials science; and (8) vacuum microelectronics. The tentative list of invited speakers includes scientists from Japan, Germany, Jordan, Sweden, Britain, France, Belgium, and the United States. %%%The IFES Symposia bring together scientists who utilize field emission, field-ion, atom-probe field-ion, and/or three-dimensional atom-probe field-ion microscopy for part of or all of their research efforts. The IFES Symposia is unique in that it is the only symposium that brings this eclectic group of scientists together for four days once every one to two years. The focus is on how these instruments can be used to solve a wide range of significant physical and technological problems. This symposium is important to researchers who use these experimental techniques because it is the only conference where the focus is primarily on these research tools and their applications to awide range of physical problems.***