MRI: Acquisition of a Low-Vacuum SEM Microscope for Multi-Disciplinary Research and Education

0116385 Scherer该奖项通过重大研究仪器计划获得，为低真空扫描电子显微镜（LV SEM）的收购提供部分支持。主要研究人员包括来自北方伊利诺斯大学文理学院三个不同系的四名教员。 研究所的LV SEM主要应用包括：冰川沉积过程和极地浮游生物生物地层学研究，以及涉及冰下沉积物微观结构检查的演化;环境生物地球科学研究，包括分析参与有机溶剂生物降解的微生物的空间分布;现代土壤和第四纪古土壤的研究，以检查其当前和历史的固碳能力;植物形态学和系统学，民族植物学，保护生物学和植物生物复杂性的研究;以及在教育项目中的应用，包括研究培训、本科课程和社区外展教育项目。 购买的仪器是JEOL 5600 LV，它可以在高真空或低真空下工作，配有Noran Vantage DSI光谱成像系统X射线分析仪（EDS）。用于观察的样品几乎不需要预处理，并且大样品（最大15 cm）可以在没有金涂层的情况下成像。这是一种非破坏性的方法，非常适合检查独特的标本，如全息图或文物，湿或脱气样品可以直接分析。***

0116385SchererThis award, made through the Major Research Instrumentation Program, provides partial support for the acquisition of a low vacuum scanning electron microscope (LV SEM). The principal investigators include four faculty members from three different departments in the College of Liberal Arts and Sciences at Northern Illinois University. Principal applications of the LV SEM by the PIs include: studies of glacial-sedimentary processes and polar plankton biostratigraphy and evolution entailing examination of microstructures in subglacial sediments; studies in the environmental biogeosciences, including analysis of the spatial distribution of microorganisms involved in biodegradation of organic solvents; studies of modern soils and Quaternary paleosols to examine their current and historic ability to sequester carbon; studies in plant morphology and systematics, ethnobotany, conservation biology, and botanical biocomplexity; and applications in educational programs, including research training, undergraduate coursework, and community outreach education programs. The instrument to be purchased is the JEOL 5600LV, which can operate at either high vacuum or low vacuum, with the Noran Vantage DSI spectral imaging system X-ray analyzer (EDS). Samples for observation require virtually no pretreatment, and large samples (up to 15 cm) can be imaged without gold-coating. This is a non-destructive method, perfect for examination of unique specimens, such as holotypes or artifacts, and wet or outgassing samples can be directly analyzed. ***