SBIR Phase I: Innovative Assessment of Induced Subsurface Stress in Single Crystal Materials Using Photon Induced Positron Annihilation (PIPA)

这个小型企业创新研究(SBIR)第一阶段项目将进行旨在表征单晶和复杂多晶材料表面处理引起的亚表面残余应力的研究。光子诱导正电子湮没(PIPA)将被用来定量单晶材料和工作元件在高应力/高温环境下的亚表面残余应力。PIPA作为一种无损材料表征技术，有可能为导致失效的关键部件应用的先进金属/金属间化合物合金的原子水平、晶格结构变化提供可量化的经验数据。在商业上，政府和工业界每年花费数十亿美元维护和维修零部件和系统。许多维护程序基于保守的工程模型，而不是实际的经验数据，导致部件提前更换、加速维护周期，以及对故障机制采取被动而不是主动的方法。PIPA提供有关材料特性的实时、经验信息，重新定义保守的预测模型，并根据材料损坏的实际评估，为决策者提供评估材料和部件以进行扩展或替换考虑的硬数据。

This Small Business Innovation Research (SBIR) Phase I project will perform research aimed atcharacterizing subsurface residual stresses induced through surface treatments in singlecrystal and complex polycrystalline materials. Photon Induced Positron Annihilation(PIPA) will be used to quantify subsurface residual stress in single crystal materials and operational components subjected to high stress/high temperature environments. PIPA as a nondestructive material characterization technology has the potential to provide quantifiable, empirical data on atomic level, lattice structure changes in advanced metallic/intermetallic alloys used for critical component applications that result in failure. Commercially, government and industry spend billions of dollars each year in the maintenance and repair of components and systems. Many of the maintenance procedures are based upon conservative engineering models instead of actual empirical data, leading to early replacement of components, accelerated maintenance cycles, and a reactive versus proactive approach to failure mechanisms. PIPA provides real-time, empirical information on material characterization, redefining conservative prediction models and supplying decision makers with the hard data to evaluate materials and components for extension or replacement considerations, based upon the actual assessment of material damage.