SBIR Phase I: Sub-100nm Infrared Spectroscopy based on Atomic Force Microscopy
SBIR Phase I: Sub-100nm Infrared Spectroscopy based on Atomic Force Microscopy
批准号:
0638338
负责人:
Kevin Kjoller
金额:
$10.0万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2007
资助国家:
美国
项目状态:
已结题
起止时间:
2007-01-01 至 2007-06-30
中文摘要
该小型企业创新研究(SBIR)第一阶段项目将开发一种新的纳米级表征系统,该系统将能够通过其振动红外(IR)光谱特征识别材料或生命结构表面上的分子种类,具有低于100 nm的空间分辨率,从而打破5微米分辨率障碍,限制了IR光谱和成像。红外成像和光谱的空间分辨率提高了50倍,这是通过我们创新的多学科方法实现的,该方法将可调谐中红外激光器和近场热探针的最新突破与新型热检测技术结合在一起。该产品将基于原子力显微镜(AFM)平台,从而使这一纳米技术研究的主力具有化学分析功能,缺乏化学分析功能是AFM用户的关键瓶颈。作为一种检测机制,它将使用激光照射产生的光热效应,这将由敏感的纳米探针进行监测。相对于扫描近场光学显微镜的研究领域,该技术有望具有更好的信噪比(因为我们将不再受到与小光子通量的检测相关的困难的限制),从而实现了通向商业上可行的产品的真实的路径。在商业上,自从它导致在二战期间发现合成橡胶以来,红外光谱技术一直是一种关键的和普遍存在的分析技术,它本身包括一个$1Bill/年的行业,并且对于几个数十亿美元的行业(如材料和制药)的研究和制造至关重要。然而,由于缺乏纳米级红外成像和光谱学,材料工业在纳米技术研究和制造方面的大量投资导致了新材料发现的瓶颈。 此外,一封支持信指出了纳米生物技术的影响,该信强调了纳米生物技术在癌症筛查和组织重塑中的应用。这种更广泛影响的另一个证据是每年2亿美元的原子力显微镜(AFM)行业。AFM是纳米技术研究的主力工具,它提供的信息驱动了1.2美元国家纳米技术倡议资助研究的很大一部分。然而,所有领先的AFM用户和制造商所确定的最严重的瓶颈是缺乏AFM提供的化学分析功能。(在2004年NIST关于纳米计量学国家优先事项的会议上被列为重大挑战主题)
英文摘要
This Small Business Innovation Research (SBIR) Phase I project will develop a new nanoscale characterization system which will be capable of identifying molecular species on the surfaces of materials or living structures, through their vibrational Infrared (IR) spectral signatures, with sub-100nm spatial resolution and thus break the 5 micron resolution barrier that has limited IR spectroscopy and imaging. This 50 times improvement in spatial resolution of IR imaging and spectroscopy is enabled by our innovative multi-disciplinary approach which couples recent breakthroughs in tunable mid-IR lasers and near field thermal probes together with novel thermal detection techniques. The product will be based on an Atomic Force Microscope (AFM) platform thus enabling this workhorse of nanotechnology research to have chemical analysis functionality, the lack of which is a crucial bottleneck for AFM users. As a detection mechanism,it will use photothermal effects created by laser irradiation, which will be monitored by a sensitive nanoprobe. In contrast to the research area of scanning near-field optical microscopy, the technique is expected to have much better signal-to-noise ratio (since we will no longer be limited by the difficulties associated with detection of small photon fluxes) thus enabling a real path to a commercially viable product.Commercially, ever since it led to the discovery of synthetic rubber during WWII, IR spectroscopy has remained a critical and ubiquitous analytical technique which itself comprises a $1Bill/yr industry and is crucial for the research and manufacturing in several multi-billion dollar industries such as materials and pharmaceuticals. However, the lack of nanoscale Infrared imaging and spectroscopy is leading to bottlenecks in the discovery of new materials given the large investment made by the Materials Industry in nanotechnology based research and manufacturing. Also, the impact to nano-biotechnology is pointed out by a letter of support which highlights applications in cancer screening and tissue remodeling. Another evidence for this broader impact is seen in the $200 Mill/yr Atomic Force Microscopy (AFM) industry. The AFM is a workhorse instrument of nanotechnology research and the information it provides drives a large part of the $1.2 Bill National Nanotechnology Initiative funded research. However, the most serious bottleneck identified by all leading AFM users and manufacturers is the lack of chemical analysis functionality provided by the AFM. (Ranked as a Grand Challenge subject in the 2004 NIST conference on National Priorities for Nanometrology)
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SBIR Phase I: Nanothermal Dynamic Mechanical Analysis System For Highly Crosslinked And Filled Polymers
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批准号:1047437
-
项目类别:Standard Grant
-
资助金额:$15.0万
-
财政年份:2011
-
负责人:Kevin Kjoller
-
依托单位:
SBIR Phase II: Sub-100nm Infrared Spectroscopy Based on Atomic Force Microscopy
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批准号:0750512
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项目类别:Standard Grant
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资助金额:$50.0万
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财政年份:2008
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负责人:Kevin Kjoller
-
依托单位:
国内基金
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