SBIR Phase II: Sub-100nm Infrared Spectroscopy Based on Atomic Force Microscopy

这个小型企业创新研究(SBIR)第二阶段项目寻求开发一种表征系统的原型，该系统可以在低于100 nm的空间分辨率下执行红外光谱和成像，从而打破过去50年来限制红外光谱的5微米分辨率障碍。这一空间分辨率的50倍突破是由光热诱导共振(PTIR)专利技术实现的，该技术的可行性已在第一阶段工作中得到证明。红外光谱是一项关键的分析技术，其本身就构成了每年10亿美元的行业。然而，其空间分辨率的限制严重限制了需要纳米级化学成分信息的研究人员。纳米级红外光谱的潜在影响范围从新材料的发现到高价值应用中界面性质的改善。

This Small Business Innovation Research (SBIR) Phase II project seeks to develop the prototype of a characterization system which can perform IR spectroscopy and imaging at sub-100nm spatial resolution and thus break the 5 micron resolution barrier that has limited IR spectroscopy for the last 50 years. This 50x breakthrough in spatial resolution is enabled by the proprietary technique of Photo-Thermal Induced Resonance (PTIR) whose feasibility has already been demonstrated in the Phase I work.IR spectroscopy is a critical analytical technique which itself comprises a $1 Billion/yr industry. However, its spatial resolution limitation has seriously limited researchers who need information on nanoscale chemical composition. The potential impact of nanoscale IR ranges from new materials discovery to interfacial property improvements in high value applications.