STTR Phase I: Focused Ion Beam Fabricated Custom Probes for Superior Magnetic Force Microscopy of Recording Media

这个小企业技术转移研究（STTR）第一阶段项目的目的是将磁力显微镜（MFM）的数据存储和存储器应用到下一个成像水平，从而将MFM变成纳米磁性和自旋电子学应用新兴时代的关键工具。该研究将集成成本效益的聚焦离子束（FIB）为基础的制造方法与微磁场模拟开发定制探头相比，传统的MFM探头具有上级性能。将努力实现以下两个目标。首先，将研究开发在室温下空间分辨率小至5 nm的FIB修饰探针。相比之下，今天，用MFM分辨的特征尺寸跨越30至60 nm，而AFM的分辨率为1 nm的量级。其次，将开发一种方法来提高MFM测量的信息质量。新的超高分辨率MFM不仅能够测量磁场强度（如传统MFM），还能够测量磁场沿着选定方向的分量。微磁模拟和互易性原理将用于预测基于FIB的MFM探针的修改，以满足特定应用的特定定制要求。MFM应用的范围非常广泛，从FBI对秘密信息的准确分析到静磁细菌的基础研究。虽然所有这些应用最终都将受益于这项技术，但目前的重点将放在磁数据存储和存储器应用上，在这些应用中，MFM的进步可能在下一代系统的开发中发挥关键作用。最后，新的超高分辨率MFM可能成为未来自旋电子学相关应用的关键仪器。例如，提供非常规高分辨率MFM图像的能力可以揭示记录介质中磁畴的纳米级特性，并有助于超高密度系统的开发。至于测量场取向的能力，这可以成为表征纵向和垂直磁存储介质的真正独特的成像特征，其中杂散场取向表示每种介质类型的签名：从比特转变测量的杂散场分别主要垂直于平面或沿着纵向和垂直介质中的轨道。总之，所提出的跨学科集成方法可能会导致超高分辨率MFM的创建，其具有对未来数据存储和存储器相关应用至关重要的独特功能。

This Small Business Technology Transfer Research (STTR) Phase I project is aimed at bringing magnetic force microscopy (MFM) for the data storage and memory applications to the next level of imaging thus turning MFM into a critical tool in the emerging era of nanomagnetic and Spintronics applications. The research will integrate cost-effective focused ion beam (FIB) based fabrication methods with micromagnetic field simulations to develop custom probes with superior properties as compared to conventional MFM probes. The following two goals will be pursued. First, research will be conducted to develop FIB-modified probes with the spatial resolution as small as 5 nm at room temperature. For comparison, today, the feature size resolved with MFM spans from 30 to 60 nm while the resolution of AFM is of the order of 1 nm. Second, a method to improve the quality of the information measured by MFM will be developed. The new ultra-high-resolution MFM will be able to measure not only the strength (as in conventional MFM) but also components of the field along selected directions. Micromagnetic simulations and the principle of Reciprocity will be used to predict FIB-based modifications to MFM probes necessary to satisfy certain custom requirements specific to certain applications.The span of MFM applications is truly diverse, from an accurate analysis of secret information by the FBI to a fundamental study of magnetostatic bacteria. Though all these applications will eventually benefit from this technology, the current emphasis will be placed on the magnetic data storage and memory applications where advancements in MFM could play a pivotal role in the development of next generation systems. Finally, the new ultra-high-resolution MFM could become a critical instrument for future Spintronics related applications. For example, the ability to provide unconventionally high resolution MFM images could shed light on the nanoscale properties of magnetic domains in the recording media and help the development of ultra-high density systems. As for the ability to measure the field orientation, this may become a truly unique imaging feature to characterize longitudinal and perpendicular magnetic storage media in which the stray field orientation represents the signature of each media type: the stray field measured from the bit transitions is predominantly perpendicular to the plane or along the track in longitudinal and perpendicular media, respectively. In summary, the proposed interdisciplinary integration approach may lead to the creation of ultra-high-resolution MFM with unique features critical for future data storage and memory related applications.