MRI: Acquisition of a Monochromated, Aberration-Corrected, Ultra High Resolution Transmission Electron Microscope for the Univ. of Michigan's Electron Microbeam Analysis Laboratory

技术这项计划资助了一种新型的先进的、球差校正的高分辨率透射电子显微镜，它将设在密歇根大学北校区电子微束分析实验室。该仪器在扫描传输模式下的分辨率为0.8埃。它将使研究人员能够在真正的原子水平上确定材料的化学、原子结构、成键特征和三维成像。虽然它将是支持密歇根大学广泛的纳米技术和能源研究项目的关键工具，但它也将作为密歇根东南部和周边各州的研究机构的资源运营，无论是工业机构还是学术界机构。该仪器将拥有一支300千伏的单色场发射枪，并将对探针形成系统进行球差校正。成像系统将允许扫描成像和静态射束成像。在高角度年度暗场探测器的扫描成像中，这种显微镜将允许原子分辨率成像与原子序数对比度。化学分析将通过高分辨率电子能量损失光谱、会聚束电子衍射和能量色散X射线光谱分析进行。非技术该计划资助一种新的高分辨率透射电子显微镜，这是一种成像极精细材料结构的仪器，对密歇根大学和密歇根东南部其他研究机构的成功纳米技术和能源研究至关重要。透射式电子显微镜使用非常高能量的电子束(300,000伏)代替光来探测材料的薄片或颗粒。这些样本非常薄，需要250个样本才能与人类平均头发的厚度相匹配。新显微镜的成像分辨率将高于密歇根州以前的任何显微镜。例如，它将能够成像硅设备原子晶格中的单个杂质原子。该仪器还将能够使用所谓的光谱技术对这些样品进行化学分析。光谱学包括测量高能电子束与样品相互作用时样品发出的电子或X射线的能量范围。该仪器将允许该地区的研究人员在纳米技术、能源相关材料和生物技术的研究方面进行全球竞争。这将意味着密歇根州要求材料表征的研究将保持领先地位。

TechnicalThis program funds a new advanced, spherical aberration-corrected high-resolution transmission electron microscope, which will be situated in the University of Michigan North Campus Electron Microbeam Analysis Laboratory. The instrument will have a resolution of 0.8 angstroms in the scanning transmission mode. It will enable researchers to determine chemistry, atomic structure, bonding characteristics, and three-dimensional imaging of materials at the true atomic level. Although it will be a critical instrument in the support of the wide range of nano-technology and energy research programs at the university, it will also operate as a resource for research institutions, both in industry and academia, in southeastern Michigan and the surrounding states. The instrument will have a 300 kV monochromated field emission gun and will have spherical aberration correction of the probe forming system. The imaging system will allow both scanning imaging and static beam imaging. In scanning imaging with a high angle annual dark field detector this microscope will allow atomic resolution imaging with atomic number contrast. Chemical analysis will be conducted by high-resolution electron energy loss spectroscopy, convergent beam electron diffraction and energy dispersive X-ray spectrometry.Non-TechnicalThis program funds a new high resolution transmission electron microscope, an instrument that images extremely fine structure of material and is critical to successful nanotechnology and energy research in the University of Michigan and other research institutions in southeastern Michigan. In lieu of light, the transmission electron microscope uses a very high energy beam of electrons (300,000 volts) to probe the thin foils or particles of materials. The samples are so thin that 250 of them would be required to match the thickness of the average human hair. The imaging resolution of the new microscope will be higher than any previously located in Michigan. It will, for example, be able to image individual impurity atoms in the atomic lattices of silicon devices. The instrument will also be capable of performing chemical analyses of these samples, using what are known as spectroscopic techniques. Spectroscopy involves measuring the energy range of electrons or X-rays emitted by the sample when the high energy electron beam interacts with it. The instrument will allow researchers in the region to compete globally in research in nanotechnology, energy related materials and biological technologies. It will mean that research requiring materials characterization in Michigan will remain at the leading edge.