II-NEW: Infrastructure to Collect and Analyze Circuit Variability in FPGAs

在深亚微米技术中，相同的电子电路设计在一个芯片上或在两个芯片之间实现的不同实例之间显示出很小的参数变化。由此产生的电路变化对设计的质量有很大的影响。该项目计划创建一个基础设施，用于表征大量现场可编程门阵列设备上的电路可变性。提议的基础设施包括一小部分FPGA套件，以及基于网络的数据收集设置，以支持与本科生合作同时在数百个FPGA上进行变异性实验。该项目将推动对电路可变性创新应用的研究，特别是在物理不可克隆功能（PUF）方面。此外，通过让本科生参与实验数据收集，创造了一个独特的教育机会，让他们了解可变性对他们设计的影响。所提出的基础设施不仅将显著加强PI在可靠电路设计方面的研究，而且还将为更广泛的研究界提供有价值的变异性数据。

Identical designs of electronic circuits in deep-submicron technology show small parameter variations among different instances implemented on a die or in between dies. The resulting circuit variations have a strong impact on the quality of the design. This project plans to create an infrastructure for characterizing the circuit variability on a large population of Field Programmable Gate Array devices. The proposed infrastructure includes a small population of FPGA kits, as well as a web-based data-collection setup to support variability-experiments on hundreds of FPGAs at the same time, in collaboration with undergraduate students. The project will drive research into innovative applications of circuit variability, in particular into physically unclonable functions (PUF). In addition, a unique education opportunity is created to teach undergraduate students about the impact of variability on their design by making them participate in the experimental data collection. The proposed infrastructure will not only significantly enhance the PI's research in trustworthy circuit design, but also provide valuable variability data for the broader research community.