Collaborative Research:II-NEW: A Digital/VLSI Test and Reliable Computing Research Laboratory

测试是半导体行业的主要制造成本之一。设计具有可测试性特征的电路可显著降低测试成本和时间。在托莱多大学(UT)和俄亥俄北方大学(ONU)的这个合作项目中，正在建立一个“数字/VLSI测试和可靠计算研究实验室”，以开发计算密集型算法，并使用商业CAD工具来测试数字、VLSI和先进的半导体器件。正在进行的一些研究项目包括：量子细胞自动机(QCA)电路的新测试技术；芯片系统中嵌入式SRAMS的内置自测试(BIST)；使用半频测试基于SRAM的现场可编程门阵列中的延迟混叠故障；电迁移故障的分析和测试；现场可编程门阵列中软错误的测试和建模；先进半导体器件中的可靠性分析和器件故障；与测试过程中VLSI芯片功耗相关的可靠性问题；以及小延迟缺陷和测试生成。根据本项目开展的研究开发的教学模块被整合到ONU和UT的许多研究生和本科课程中。由于半导体芯片的应用广泛，包括汽车、航空航天、国防和医疗保健在内的许多不同行业可能会从这个项目中受益。

Testing represents one of the major manufacturing costs in the semiconductor industry. Designing circuits with testability features significantly reduces testing costs and time. Thus, it is important for designers to be exposed to the concepts in testing which can help them design better and reliable products.In this collaborative project between the University of Toledo (UT) and Ohio Northern University (ONU), a "Digital/VLSI Test and Reliable Computing Research Laboratory" is being established for the development of computationally intensive algorithms and use of commercial CAD tools for testing digital, VLSI, and advanced semiconductor devices.Some of the research projects being carried out include: Novel Testing Techniques for Quantum Cellular Automata (QCA) circuits; Built In Self Test (BIST) for Embedded SRAMS in System on Chips; Testing Look-Up-Table (LUT) Delay Aliasing Faults in SRAM Based FPGAs Using Half-Frequencies; Analysis and Testing of Electromigration Failures; Testing and Modeling Soft Errors in FPGAs; Reliability Analysis and Device Failures in Advanced Semiconductor Devices; Reliability Issues Related to Power Consumption in VLSI Chips during Test; and Small Delay Defects and Test Generation.Educational modules developed from the research carried out in this project are integrated into a number of graduate and undergraduate courses at ONU and UT. Since applications of semiconductor chips are far and wide, many different industries including auto, aerospace, defense and healthcare may benefit from this project.