MRI-R2: Acquisition of a Scanning Electron Microscope (SEM) and Atomic Force Microscope (AFM) for a Multidisciplinary Core Imaging Facility

该奖项由2009年美国复苏与再投资法案(公法111-5)资助。威斯康星大学拉克罗斯分校化学系、生物学系、微生物学系和物理系将获得一台扫描电子显微镜(SEM)和原子力显微镜(AFM)，以支持这些系的研究活动。这一仪器将大大扩展该大学核心成像设施的能力。将使用所要求的仪器的具体项目包括：1)调查黄金表面DNA膜的结构和稳定性，2)调查有机/无机半导体界面，3)研究全长溶血素A的结构和功能性质，4)使用半导体量子点检测单光子，5)对密西西比河上游的颗粒状食物资源进行量化以评估入侵物种的影响，6)对酿酒酵母减数分裂中有缺陷的细胞周期基因的表型进行分析，以及这些系中另外7个教员的研究项目。这种仪器将提供给大量的本科生--既有注册实验室课程的学生，也有本科生研究人员。这一群体包括相当数量的来自代表性不足群体的学生。此外，扫描电子显微镜和原子力显微镜将在校园内的研究小组和外部合作伙伴之间的一些校外合作中发挥重要作用。扫描电子显微镜和原子力显微镜是广泛使用的提供样品表面图像的技术。图像是通过扫描被研究表面上的电子束(SEM)或原子尖端(AFM)获得的。用扫描电子显微镜和原子力显微镜(约纳米或更小)可获得的分辨率明显好于光学显微镜所能获得的分辨率。获得的仪器将被安置在大学的核心成像设备中，并将由来自各种科学学科的研究人员使用。

This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5).With this award from the Major Research Instrumentation (MRI) program, the Departments of Chemistry, Biology, Microbiology, and Physics at the University of Wisconsin - La Crosse will acquire a Scanning Electron Microscope (SEM) and Atomic Force Microscope (AFM) to support research activities in these Departments. This instrumentation will significantly expand the capabilities of the University's Core Imaging Facility. Examples of specific projects that will use the requested instrumentation include: 1) the investigation of the structure and stability of DNA films on gold surfaces, 2) the investigation of organic/inorganic semiconductor interfaces, 3) the investigation of the structural and functional properties of full-length hemolysin A, 4) the use of semiconductor quantum dots to detect single photons, 5) the quantifying of particulate food resources in the upper Mississippi River as a means of evaluating the impacts of invasive species , 6) the analysis of the phenotype of defective cell cycle genes in Saccharomyces cerevisiae meiosis, as well as the research projects of seven additional faculty in these Departments. The instrumentation will be available to a large number of undergraduate students -- both students enrolled in laboratory courses as well as undergraduate researchers. This group includes a significant number of students from underrepresented groups. In addition, the SEM and AFM will feature prominently in a number of extramural collaborations between research groups on campus and external partners.Scanning electron microscopy and atomic force microscopy are widely used techniques for providing an image of a sample surface. The image is obtained by scanning an electron beam (SEM) or an atomically-sharp tip (AFM) over the surface under study. The resolution obtainable with both SEM and AFM microscopies (ca. nanometer or less) is significantly better than that achievable with optical microscopes. The instruments acquired will be housed in the University's Core Imaging Facility, and will be used by researchers from a wide variety of science disciplines.