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MRI-R2: Acquisition of an X-ray Photoelectron Spectroscopy (XPS) Surface Analysis Instrumentation for Enabling Research and Education in Greater Philadlephia

MRI-R2: Acquisition of an X-ray Photoelectron Spectroscopy (XPS) Surface Analysis Instrumentation for Enabling Research and Education in Greater Philadlephia
MRI-R2:购买 X 射线光电子能谱 (XPS) 表面分析仪器,以促进大费城的研究和教育
批准号:
0959361
负责人:
Kenneth Lau
金额:
$112.5万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2010
资助国家:
美国
项目状态:
已结题
起止时间:
2010-07-01 至 2013-06-30

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中文摘要
翻译
“本奖项是根据2009年美国复苏和再投资法案(公法111-5)资助的。”这项拟议的MRI-R2申请是为了获得最先进的x射线光电子能谱(XPS)表面分析仪器系统,用于大费城地区。XPS系统将在德雷塞尔大学建立一个开放的多用户共享仪器设施,作为该地区科学界重大研究和培训活动的焦点。目前,在大费城地区没有可供不同用户广泛使用的共享XPS设施。同样重要的是,在该领域,有大量不同的研究项目对XPS系统有迫切的需求,但获得的机会有限。因此,拟议的仪器将解决实现前沿研究的关键空白。在Drexel大学,主要的研究项目,包括Drexel等离子体研究所和Drexel纳米技术研究所,以及许多教师的个人研究项目将由XPS系统实现。此外,宾夕法尼亚大学、维拉诺瓦大学和罗文大学的许多研究工作将因易于使用这种系统而得到极大的帮助。具体来说,该提案强调了将受到XPS仪器积极影响的新兴研究活动,包括目前由NSF和其他机构资助的可持续能源、生物医学技术、纳米技术和先进材料方面的主要努力。这些研究活动需要一个多功能的XPS系统,该系统能够对所有类型的样品(如金属、无机物、有机物、陶瓷、聚合物和复合材料)进行定量的表面特异性化学分析。该系统将为这些研究活动提供宏观和微观区域元素和化学状态光谱和成像,角度分辨深度分析,溅射深度剖面分析,分别使用氩气和多原子离子枪对硬材料和软材料进行原位变温测量,以及用于光谱和测绘的俄歇电子能谱(AES),空间分辨率低于100纳米。
英文摘要
0959361Lau"This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5)."This proposed MRI-R2 application is for the acquisition of a state-of-the-art x-ray photoelectron spectroscopy (XPS) surface analysis instrumentation system for the Greater Philadelphia region. The XPS system will be established as an openly accessible multi-user shared instrumentation facility at Drexel University that serves as a focal point for significantly enabling research and training activities in the scientific community in the region. Currently, there is no shared XPS facility widely accessible by different users in Greater Philadelphia. Equally important, there are a significant and diverse range of research programs In the area that have a critical need for an XPS system but have limited access to one. As such, the proposed instrumentation will address a key void in enabling leading edge research. At Drexel University, major research initiatives, including the Drexel Plasma Institute and the Drexel Nanotechnology Institute, as well as many individual faculty research projects will be enabled by the XPS system. In addition, numerous research efforts at the University of Pennsylvania, Villanova University and Rowan University will be considerably aided by easy access to such an system. Specifically, this proposal highlights emerging research activities that will be positively impacted by the XPS instrumentation, including major efforts in sustainable energy, biomedical technology, nanotechnology and advanced materials currently funded by the NSF and other agencies. These research activities require a multicapability XPS system that is able to perform quantitative surface-specific chemical analysis of all types of samples like metals, inorganics, organics, ceramics, polymers and composites. The system will provide for these research activities macro- and micro-area elemental and chemical state spectroscopy and imaging, angle resolved depth analysis, sputter depth profiling using argon and polyatomic ion guns for hard and soft materials, respectively, in situ variable temperature measurements, and Auger electron spectroscopy (AES) for spectroscopy and mapping with a spatial resolution below 100 nm.
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