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MRI-R2: Development of an Integrated STEM Instrument with Nanoscale milli-Electron Volt Energy Loss Spectroscopy

MRI-R2: Development of an Integrated STEM Instrument with Nanoscale milli-Electron Volt Energy Loss Spectroscopy
MRI-R2:开发具有纳米级毫电子伏能量损失光谱的集成 STEM 仪器
批准号:
0959905
负责人:
Philip Batson
金额:
$197.29万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2010
资助国家:
美国
项目状态:
已结题
起止时间:
2010-04-15 至 2013-09-30

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中文摘要
翻译
0959905巴特森罗格斯大学新不伦瑞克MRI-R2:开发集成STEM仪器与纳米级毫电子伏特能量损失光谱技术摘要:该奖项是根据2009年美国复苏和再投资法案(公法111-5)资助的。扫描透射电子显微镜(STEM)中的电子能量损失谱(EELS)是现代材料开发的基础定量分析技术。 罗格斯大学和Nion公司之间的这种伙伴关系,美国一家小型企业,将使用像差校正方法开发第一台埃级EELS仪器,其能量分辨率可达10 meV。使用60-100 keV的入射电子能量,将有可能研究软和硬亚纳米材料的电子、光子和振动行为。该仪器将包括探头侧色差校正、单色仪-光谱仪能量注册的创新方法、光谱仪前的色差校正以及针对高灵敏度和高动态范围优化的2D单电子计数探测器。可排除的问题包括:纳米级物体中的声子和原子/分子振动行为,界面缺陷的电子行为,碳基分子中构型变化的能量学,以及纳米级光子和等离子体场的映射。该仪器将是一个极好的工具,用于理解许多重要的社会应用,如光化学,能量存储,催化,高温硬涂层,纳米电子学,光子学和基于纳米级过程的新兴行为材料的结构-功能关系。世界领先的空间和能量分辨率的组合将通过以非常图形和可视化的方式传达原子级功能,对激励和培训学生非常有价值。罗格斯大学多元化的学生团体及其广泛的外展社区都将受益于这种能力。 该用户设施可供科学界广泛使用,将是新泽西第一个最先进的畸变校正EELS/STEM设施,为当地教育和工业用户提供直接访问。 非技术摘要:该奖项是根据2009年美国复苏和再投资法案(公法111-5)资助的。新材料,特别是那些在纳米尺度上开发的材料,提供了满足下一代面临的许多苛刻的社会问题所需的关键进展。这种材料的设计需要可视化的原子水平的结构,成分,并在最精细的水平原子原子键合。 在过去的50年里,电子显微镜,结合电子能量损失光谱,一直是一个主力,提供结构以及原子组成的纳米级和原子键合的信息。尽管如此,纳米材料科学的最新需求仍然需要更精确和灵敏的工具。 罗格斯大学和Nion公司之间的这种合作关系,一家美国小公司,将在电子光谱学能力方面产生飞跃,使只包含几个原子的结构的功能可视化-甚至到单分子,这是一个迄今为止无法实现的领域。新工具有助于创造有效的能源生产和储存,催化,纳米电子学,光子学所需的新材料,以及尚未创造的新材料。高度可视化的信息也将在激励学生和培养未来一代先进材料科学家和工程师方面发挥重要作用。该仪器将位于罗格斯大学的表面改性实验室,并将由先进材料,器件和纳米技术研究所管理。该设施将成为世界领导者,为新泽西地区带来新的资源,以促进科学理解,教育推广,工业互动以及与其他国家和国际科学机构的合作。
英文摘要
0959905BatsonRutgers U. New BrunswickMRI-R2: Development of an Integrated STEM Instrument with Nanoscale milli-Electron Volt Energy Loss Spectroscopy Technical Summary: This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5). Electron Energy Loss Spectroscopy (EELS) in the Scanning Transmission Electron Microscope (STEM) is a bedrock quantitative analytical technique for modern materials development. This partnership between Rutgers University and Nion, Co., a small US business, will use aberration correction methods to develop the first Angstrom-level EELS instrument capable of 10 meV energy resolution. Using incident electron energies of 60-100 keV, studies of electronic, photonic and vibronic behavior of soft and hard sub-nanoscale materials will be possible. The instrument will include probe side chromatic aberration correction, an innovative method for monochromator-spectrometer energy registry, pre-spectrometer aberration correction, and a 2D single electron counting detector optimized for high sensitivity and high dynamic range. Accessible problems include: phonon and atomic/molecular vibrational behavior in nanoscale objects, electronic behavior of interfacial defects, energetics of configuration changes in carbon-based molecules, and mapping of nanoscale photonic and plasmonic fields. The instrument will be a superb tool for understanding structure-function relationships in numerous materials of importance to societal applications such as photovoltaics, energy storage, catalysis, high temperature hard coatings, nanoelectronics, photonics, and emergent behavior based on nanoscale processes. The world-leading combination of spatial and energy resolution will be valuable for motivating and training of students by communicating atomic level functionality in very graphic and visual ways. Rutgers diverse student body and its extensive outreach community will both benefit from this capability. This user facility, accessible to a broad portion of the scientific community, will be the first state-of-the-art aberration corrected EELS/STEM facility in New Jersey, providing direct access for both local educational and industrial users. Non-Technical Summary: This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5). New materials, particularly those developed on the nanoscale, provide critical advances required to meet many of the demanding societal problems confronting the next generations. The design of such materials requires visualization of atomic level structure, composition, and bonding at the finest level-atom by atom. For the past 50 years, electron microscopy, combined with electron energy loss spectroscopy, has been a workhorse, providing structure as well as atomic composition on the nanoscale and information on atomic bonding. Nevertheless, the most recent demands of nano-scale materials science require still more precise and sensitive tools. This partnership between Rutgers University and Nion Co., a small US business, will produce a leap ahead in electron spectroscopy capabilities to allow visualization of the function of structures which contain only a few atoms -- even down to single molecules, a region unattainable till now. The new tool aid the creation of new materials required for efficient energy production and storage, catalysis, nanoelectronics, photonics, and new materials yet to be created. The highly visual information will also play a significant role in motivating students, and preparing the future generation of advanced materials scientists and engineers. The instrument will be located at Rutgers University in the Laboratory for Surface Modification and will be administered by the Institute for Advanced Materials, Devices and Nanotechnology. This facility will be a world leader, bringing to the New Jersey region a new resource for the advancement of scientific understanding, for educational outreach, industrial interaction, and collaboration with other national and international scientific institutions.
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