SaTC-EDU: PHIKS - PHysical Inspection and attacKs on electronicS

硬件安全社区在过去十年中有了显著的发展。然而，对逆向工程、物理攻击和伪造检测等最先进主题的研究仍然停留在调查和/或开发的早期阶段。首先，拥有和维护所需的仪器对学术界来说太过困难，从而将研究限制在工业和政府的几个重点实验室中。其次，充分理解这些主题并应对其挑战所需的知识和专业知识位于多个不重叠的科学领域的交叉点，包括显微镜，物理学，材料科学和计算机工程。第三，电子硬件跨越多个层次（器件、芯片、印刷电路板和系统），每个层次都有独特的攻击模式和要求。尽管一些书籍章节和调查试图弥合这些差距，但它们只向学术研究人员、学生和从业者介绍了基本概念。这个项目的目标是创建一门课程，让学生了解硬件安全方面的高级主题。具体而言，将创建十个教育模块，包括(1)破坏性和非破坏性逆向工程的背景和动机，侵入性和非侵入性探测，故障注入和伪造检测；(2)检测/攻击设备的基本原理，包括光学显微镜、扫描电子显微镜、聚焦离子束显微镜、光子发射显微镜、x射线显微镜等；(3)介绍了在硬件安全背景下理解显微镜数据所需的图像处理、机器学习和分类技术。每个模块的组成部分将包括一个或多个讲座，一个交互式设备演示，一个原型数据集，以及多种形式的评估（测验，实验室实验和考试）。数据集和演示将基于先前的研究实验以及使用佛罗里达大学可用的世界级仪器进行的新实验而生成。通过向学术界提供教育材料，该项目将对网络安全、故障分析和电子测试方面的教育和劳动力发展产生重大影响。该奖项反映了美国国家科学基金会的法定使命，并通过使用基金会的知识价值和更广泛的影响审查标准进行评估，被认为值得支持。

The hardware security community has grown significantly over the past decade. However, research on the most advanced topics such as reverse engineering, physical attacks, and counterfeit detection remains stuck in the early stages of investigation and/or development. First, owning and maintaining the required instrumentation is too prohibitive for academia, thereby limiting research to a few focused labs in industry and government. Second, the knowledge and expertise needed to fully understand these topics and to address their challenges lies at the intersection of multiple non-overlapping scientific fields including microscopy, physics, material science, and computer engineering. Third, electronic hardware spans multiple levels (device, chip, printed circuit board, and system), which are each subject to unique attack modes and requirements. Although some book chapters and surveys have attempted to bridge these gaps, they only introduce the basic concepts to academic researchers, students, and practitioners.The goal of this project is to create a course that exposes students to advanced topics in hardware security. Specifically, ten educational modules will be created that cover (1) the background and motivation for destructive and non-destructive reverse engineering, invasive and non-invasive probing, fault injection, and counterfeit detection; (2) the fundamentals of inspection/attack equipment including optical microscope, scanning electron microscope (SEM), focused ion beam (FIB), photon emission microscope (PEM), and X-ray microscope (XRM); and (3) an introduction to the image processing, machine learning, and classification techniques needed to make sense of microscopy data in the context of hardware security. The components of each module will include one or more lectures, an interactive equipment demonstration, an archetypal data set, and multiple forms of assessment (quiz, lab experiment, and exam). Data sets and demos will be generated based on prior research experiments as well as new experiments using the world class instruments available at University of Florida. By making the educational materials available to the academic community, this project will have a significant impact on education and workforce development in cybersecurity, failure analysis, and electronics testing.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.