Combined / Integrated Optical Tweezers and Atomic Force Microscope System

在该提案中，要求一种专门设计的仪器，由原子力显微镜（AFM）和双光束光镊（OT）系统（称为OT-AFM-Combo系统）组合而成。该仪器提案背后的基本思想涉及建立一个集成平台，用于同时或顺序的单分子/物体操作和单分子分析，具有高精度的化学和物理表面表征。这将允许进行创新实验，这将提高对固液界面分子间相互作用的基本理解。OT-AFM-Combo系统是必要的，以便在介观水平上详细研究固液界面，同时进行单物体操作。此外，该系统对于执行局部化学功能化（使用OT部分）和即将进行的表面分析（使用AFM部分）以直接了解局部结构对化学功能化效率所起的作用是必要的。功能化对局部表面化学和物理性质的影响可以用这种方式来解释。重要的是，设备的安装应尽量减少振动，并尽可能多地用于连接外部设备和未来的扩展/升级。

In this proposal, a specialized and tailor-designed instrument made up of a combination of an Atomic Force Microscope (AFM) and a dual beam Optical Tweezers (OT) system, referred to as OT-AFM-Combo System, is being requested. The fundamental idea behind the proposal for this instrument concerns the establishment of an integrated platform for simultaneous or sequential single molecule / object manipulation and single molecule analysis with high precision chemical and physical surface characterization. This will allow innovative experiments to be performed, which would improve the fundamental understanding of intermolecular interactions at solid-liquid-interfaces. The OT-AFM-Combo System is necessary in order to study solid-liquid-interfaces in detail at a mesoscopic level concomitantly with single object manipulation. Moreover, the system is necessary for performing local chemical functionalization (using the OT part) and imminent surface analysis (using the AFM part) to directly understand the role played by local structure on the efficiency of chemical functionalization. The effect of functionalization on the local surface chemical and physical properties can be deciphered in this manner. It is important that the equipment is installed minimizing vibrations and with the maximum possible versatility for interfacing external equipment and for future expansions / upgrades.