Ultra-high vacuum low temperature scanning probe microscope (UHV-LTSPM)

超高真空扫描探针显微镜（UHV-LTSPM）将构成“纳米科学与纳米技术”研究领域的关键工具：我们将主要使用它来精确测定先进二维材料的几何和电子结构。我将使用表面科学的方法制备和表征纳米材料。特别是，LTSPM可以进行最高空间分辨率和高能量分辨率的光谱分析。原子力显微镜（AFM）将使我们能够超越我们以前的研究，因为它可以研究单个化学键以及绝缘系统的表征。该装置显著地拓宽了可达到的温度范围。我们将详细讨论以下主题：(i)二维金属中的相关电子，（ii）过渡金属二硫族化合物的异质结构，（iii）六方氮化硼缺陷电子特性的分类和表征（潜在的单光子源），（iv）超薄铁电材料（如GeSe）作为传感器和非易失性存储器候选材料的研究，(v)外延生长锡钙钛矿作为光伏替代材料的表征，特别注意缺陷的影响。

The ultra-high vacuum scanning probe microscope (UHV-LTSPM) will constitute a key tool in the research field “Nanoscience and Nanotechnology”: We will mainly use it for the precise determination of the geometric and electronic structure of advanced two-dimensional materials. I will enable preparation and characterization of nanomaterials using the methods of surface science. In particular, the LTSPM can perform spectroscopy with the highest spatial resolution and high resolution in energy. Atomic force microscopy (AFM) will allow us to go beyond our previous studies as it enables the study of individual chemical bonds as well as the characterization of insulating systems. The apparatus significantly widens the accessible temperature range.In detail we will address the following topics: (i) Correlated electrons in two-dimensional metals, (ii) heterostructures of transition metal dichalcogenides, (iii) classification and characterization of the electronic properties of defects in hexagonal boron nitride (potential single photon sources), (iv) investigation of ultrathin ferroelectric materials (e. g. GeSe) as candidates for sensors and non-volatile memory, and (v) characterization of epitaxially grown tin perovskites as alternative materials for photovoltaics with special attention to the influence of defects.